Quantitative measurement of binary liquid distributions using multiple-tracer x-ray fluorescence and radiography

Thumbnail Image
Date
2015-01-01
Authors
Halls, Benjamin
Meyer, Terrence
Kastengren, Alan
Major Professor
Advisor
Committee Member
Journal Title
Journal ISSN
Volume Title
Publisher
Authors
Research Projects
Organizational Units
Organizational Unit
Mechanical Engineering
The Department of Mechanical Engineering at Iowa State University is where innovation thrives and the impossible is made possible. This is where your passion for problem-solving and hands-on learning can make a real difference in our world. Whether you’re helping improve the environment, creating safer automobiles, or advancing medical technologies, and athletic performance, the Department of Mechanical Engineering gives you the tools and talent to blaze your own trail to an amazing career.
Journal Issue
Is Version Of
Versions
Series
Department
Mechanical Engineering
Abstract

The complex geometry and large index-of-refraction gradients that occur near the point of impingement of binary liquid jets present a challenging environment for optical interrogation. A simultaneous quadruple-tracer x-ray fluorescence and line-of-sight radiography technique is proposed as a means of distinguishing and quantifying individual liquid component distributions prior to, during, and after jet impact. Two different pairs of fluorescence tracers are seeded into each liquid stream to maximize their attenuation ratio for reabsorption correction and differentiation of the two fluids during mixing. This approach for instantaneous correction of xray fluorescence reabsorption is compared with a more time-intensive approach of using stereographic reconstruction of x-ray attenuation along multiple lines of sight. The proposed methodology addresses the need for a quantitative measurement technique capable of interrogating optically complex, near-field liquid distributions in many mixing systems of practical interest involving two or more liquid streams.

Comments

This article is from Optics Express 23 (2015): 1730, doi: 10.1364/OE.23.001730. Posted with permission.

Description
Keywords
Citation
DOI
Subject Categories
Copyright
Thu Jan 01 00:00:00 UTC 2015
Collections