Chemical and Biological Engineering, Mechanical Engineering
Journal or Book Title
Atomization and Sprays
The characterization of a spray in the near-field region is challenging because of its high optical density in this region. X-ray based techniques, with weak scatter and strong penetration properties, can provide better characterization than optical assessment techniques in this region. In this work, the effects of various operating parameters on the evaluation of the optical depth (defined as the accumulated liquid thickness in the beam path times the X ray attenuation coefficient) and spray profile of an atomizing spray in the near-field region are evaluated based on time-averaged X-ray analysis techniques. Controlling parameters in the spray structure include swirl ratio, liquid phase Reynolds number, and gas phase Reynolds number. Data from the broadband X-ray radiographs obtained using a tube source at Iowa State University and from focused beam measurements at the Advanced Photon Source at Argonne National Laboratory are compared. The X-ray tube source at ISU was operated at two different energy levels, which reveals that the X-ray tube source energy influenced the magnitude of the optical depth but did not change the shape of the distribution. For the no swirl condition, gas flow rate and liquid flow rate had opposite effects on the spray profile, where the spray widens as the gas flow rate increases and narrows as the liquid flow rate increases. As the swirl ratio increases from 0 to 1, the spray widens and then narrows, which indicates that the effect of swirl being more dramatic and then weaker. The critical swirl ratio at which the spray reaches its widest spread differs at different flow conditions.
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Li, Danyu; Bothell, Julie; Morgan, Timothy; Machicoane, Nathanaël; Aliseda, Alberto; Kastengren, Alan; and Heindel, Theodore J., "Time-averaged Spray Analysis in the Near-field Using Broadband and Narrowband X-ray Measurements" (2019). Mechanical Engineering Publications. 378.
Available for download on Friday, August 28, 2020