Journal or Book Title
This paper presents a technique that reaches 3-D shape measurement speed beyond the digital-light-processing (DLP) projector’s projection speed. In particular, a “solid-state” binary structured pattern is generated with each micro-mirror pixel always being at one status (ON or OFF). By this means, any time segment of projection can represent the whole signal, thus the exposure time can be shorter than the projection time. A sinusoidal fringe pattern is generated by properly defocusing a binary one, and the Fourier fringe analysis means is used for 3-D shape recovery. We have successfully reached 4,000 Hz rate (80 µs exposure time) 3-D shape measurement speed with an off-the-shelf DLP projector.
This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OE.18.019743. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
Optical Society of America
Gong, Yuanzheng and Zhang, Song, "Ultrafast 3-D shape measurement with an off-the-shelf DLP projector" (2010). Mechanical Engineering Publications. 95.