Document Type

Article

Publication Date

6-1-2001

Journal or Book Title

Journal of Applied Physics

Volume

89

Issue

11

First Page

7009

Last Page

7011

DOI

10.1063/1.1363604

Abstract

A micromagnetic model has been developed for investigating the effect of stress on the magnetic properties of thin films. This effect has been implemented by including the magnetoelastic energy term into the Landau–Lifshitz–Gilbert equation. Magnetization curves of a nickelfilm were calculated under both tensile and compressive stresses of various magnitudes applied along the field direction. The modeling results show that coercivity increased with increasing compressive stress while remanence decreased with increasing tensile stress. The results are in agreement with the experimental data in the literature and can be interpreted in terms of the effects of the applied stress on the irreversible rotation of magnetic moments during magnetization reversal under an applied field.

Comments

The following article appeared in Journal of Applied Physics 89 (2001): 7009 and may be found at http://dx.doi.org/10.1063/1.1363604.

Rights

Copyright 2001 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

Copyright Owner

American Institute of Physics

Language

en

File Format

application/pdf

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