Document Type

Article

Publication Date

12-10-2010

Journal or Book Title

Physical Review Letters

Volume

105

First Page

245501

DOI

10.1103/PhysRevLett.105.245501

Abstract

In situ x-ray diffraction (XRD) coupled with molecular dynamics (MD) simulations have been used to quantify antisite defect trapping during crystallization. Rietveld refinement of the XRD data revealed a marked lattice distortion which involves an a axis expansion and a c axis contraction of the stable C11b phase. The observed lattice response is proportional in magnitude to the growth rate, suggesting that the behavior is associated with the kinetic trapping of lattice defects. MD simulations demonstrate that this lattice response is due to incorporation of 1% to 2% antisite defects during growth.

Comments

This article is from Physical Review Letters 105 (2010): 245501, doi:10.1103/PhysRevLett.105.245501. Posted with permission.

Copyright Owner

American Physical Society

Language

en

File Format

application/pdf

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