The present invention provides a method of analyzing for a specific material in a sample using a sensor including a resonating member having resonating properties. The resonating member has a probe and a known material is disposed on or forms the probe. The method includes the steps of positioning the sensor proximate to the sample, detecting a force dependent change in the resonance properties of the sensor, and confirming the presence of the specific material based on the identity of the known material and the detection of a resonance change.
ISURF Reference Number
Iowa State University Research Foundation, Inc.,
Henderson, Eric R.; Mosher, Curtis L.; Jones, Vivian Wynne; Green, John-Bruce D.; and Porter, Marc D., "Analytical method using modified scanning probes" (1998). Iowa State University Patents. 131.