Campus Units

Physics and Astronomy, Ames Laboratory

Document Type

Article

Publication Version

Published Version

Publication Date

6-15-2012

Journal or Book Title

European Physical Journal Special Topics

Volume

208

Issue

1

First Page

141

Last Page

155

DOI

10.1140/epjst/e2012-01615-2

Abstract

The element- and site-specificity of X-ray resonant magnetic scattering (XRMS) makes it an ideal tool for furthering our understanding of complex magnetic systems. In the hard X-rays, XRMS is readily applied to most antiferromagnets where the relatively weak resonant magnetic scattering (10−2–10−6 I c ) is separated in reciprocal space from the stronger, Bragg charge scattered intensity, I c . In ferro(ferri)magnetic materials, however, such separation does not occur and measurements of resonant magnetic scattering in the presence of strong charge scattering are quite challenging. We discuss the use of charge-magnetic interference resonant scattering for studies of ferromagnetic (FM) crystals and layered films. We review the challenges and opportunities afforded by this approach, particularly when using circularly polarized X-rays. We illustrate current capabilities at the Advanced Photon Source with studies aimed at probing site-specific magnetism in ferromagnetic crystals, and interfacial magnetism in films.

Comments

This article is published as Haskel, Daniel, E. Kravtsov, Y. Choi, J. C. Lang, Z. Islam, G. Srajer, J. S. Jiang, S. D. Bader, and Paul C. Canfield. "Charge-magnetic interference resonant scattering studies of ferromagnetic crystals and thin films." The European Physical Journal Special Topics 208, no. 1 (2012): 141-155. DOI: 10.1140/epjst/e2012-01615-2. Posted with permission.

Creative Commons License

Creative Commons Attribution 4.0 License
This work is licensed under a Creative Commons Attribution 4.0 License.

Copyright Owner

EDP Sciences, Springer-Verlag

Language

en

File Format

application/pdf

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