Physics and Astronomy, Ames Laboratory
Journal or Book Title
European Physical Journal Special Topics
The element- and site-specificity of X-ray resonant magnetic scattering (XRMS) makes it an ideal tool for furthering our understanding of complex magnetic systems. In the hard X-rays, XRMS is readily applied to most antiferromagnets where the relatively weak resonant magnetic scattering (10−2–10−6 I c ) is separated in reciprocal space from the stronger, Bragg charge scattered intensity, I c . In ferro(ferri)magnetic materials, however, such separation does not occur and measurements of resonant magnetic scattering in the presence of strong charge scattering are quite challenging. We discuss the use of charge-magnetic interference resonant scattering for studies of ferromagnetic (FM) crystals and layered films. We review the challenges and opportunities afforded by this approach, particularly when using circularly polarized X-rays. We illustrate current capabilities at the Advanced Photon Source with studies aimed at probing site-specific magnetism in ferromagnetic crystals, and interfacial magnetism in films.
Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 International License.
EDP Sciences, Springer-Verlag
Haskel, D.; Kravtsov, E.; Choi, Y.; Lang, J. C.; Islam, Z.; Srajer, G.; Jiang, J. S.; Bader, S. D.; and Canfield, Paul C., "Charge-magnetic interference resonant scattering studies of ferromagnetic crystals and thin films" (2012). Physics and Astronomy Publications. 705.