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1975
Wednesday, January 1st
12:00 AM

How do you foresee the requirements for ultrasonic standards changing as NDE evolves from a defect detection mode to a quantitative defect characterization mode?

Tom Cooper, United States Air Force
Edward L. Caustin, Rockwell International
Jerry Gardner, Southwest Research Institute
Donald G. Eitzen, National Bureau of Standards
R Bruce Thompson, Rockwell International
William G.W Yee, Convair Aerospace
Harold Berger, National Bureau of Standards
Jerry Posakony, Battelle Northwest
Anthony N. Mucciardi, Adaptronics, Inc.
Bill Andre, National Aeronautics and Space Administration
Steve Hart, United States Navy
Ron Nokes, United States Air Force

Thousand Oaks, CA

12:00 AM

The topic of our panel discussion is: "How do you foresee the requirements for ultrasonic standards changing as NDE evolves from a defect detection mode to a defect characterization mode?"

We've heard a number of comments yesterday and today about the problem of standards. Our plan for the balance of the day in the panel session is to hear from a group of experts who have had considerable experience, and therefore, have developed varied opinions on the problem of standards. We'll hear briefly from each of them, and then have an open discussion where those in the audience are invited to participate.