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1977
Saturday, January 1st
12:00 AM

Defect Characterization-Fundamental Flaw Classification Solution Potential

Joseph L. Rose, Drexel University
Bruce Eisenstein, Drexel University
John Fehlauer, Drexel University
Michael Avioli, Drexel University

Thousand Oaks, CA

12:00 AM

Measurement of Subsurface Fatigue Crack Size Using Nonlinear Adaptive Learning

A N. Mucciardi, Apatronics, Inc.

Thousand Oaks, CA

12:00 AM

Near Real Time Ultrasonic Pulse Echo Holographic Imaging System

G J. Posakony, Pacific Northwest National Laboratory

Thousand Oaks, CA

12:00 AM

The NDT Program at Stanford University

Gerry S. Kino, Stanford University

Thousand Oaks, CA

12:00 AM