Schedule

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1978
Sunday, January 1st
12:00 AM

Applications of a New Inverse Method to Nondestructive Evaluation

N Bleistein, University of Denver
J K. Cohen, University of Denver

Ithaca, NY

12:00 AM

Experimental Measurements and Interpretation of Ultrasonic Scattering by Flaws

Bernard R. Tittmann, Rockwell International

Ithaca, NY

12:00 AM

Identification of Flaws from Scattered Ultrasonic Fields as Measured at a Planar Surface

Laszlo Adler, University of Tennessee - Knoxville
Kent Lewis, University of Tennessee - Knoxville
P Szilas, University of Tennessee - Knoxville
D Fitting, University of Tennessee - Knoxville

Ithaca, NY

12:00 AM

Implementation: Presentation Status and Future Directions

R Bruce Thompson, Rockwell International

Ithaca, NY

12:00 AM

Introduction

R Bruce Thompson, Rockwell International

Ithaca, NY

12:00 AM

Inversion of Ultrasonic Scattering Data to Measure Defect Size, Orientation, and Acoustic Properties

R Shankar, Adaptronics, Inc.
Anthony N. Mucciardi, Adaptronics, Inc
M F. Whalen, Adaptronics, Inc
M D. Johnson, Adaptronics, Inc

Ithaca, NY

12:00 AM

Long Wave Scattering of Elastic Waves from Volumetric and Crack-Like Defects of Simple Shapes

J E. Gubernatis, Los Alamos Scientific Laboratory

Ithaca, NY

12:00 AM

Utilization of Physical Features of Scattered Power for Defect Characterization

E Domany, University of Washington - Seattle Campus

Ithaca, NY

12:00 AM