Location

Ithaca, NY

Start Date

1978 12:00 AM

Description

The first Born approximation provides a useful means to study scattering of ultrasound by various defects. In particular, it seems to yield qualitatively good results for the scattered power, when averaged over a range of frequencies. Features of the scattered power that have been discovered by this method will be reviewed. Closer study of some of these features leads to a step procedure to characterize an oblate spheroidal defect; to determine its orientation and shape. Procedures for extension to other shapes can also be given. Areas of future development will be indicated.

Book Title

Proceedings of the ARPA/AFML Review of Progress in Quantitative NDE

Chapter

3. Defect Characterization by Quantitative Ultrasonics

Pages

44-45

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Utilization of Physical Features of Scattered Power for Defect Characterization

Ithaca, NY

The first Born approximation provides a useful means to study scattering of ultrasound by various defects. In particular, it seems to yield qualitatively good results for the scattered power, when averaged over a range of frequencies. Features of the scattered power that have been discovered by this method will be reviewed. Closer study of some of these features leads to a step procedure to characterize an oblate spheroidal defect; to determine its orientation and shape. Procedures for extension to other shapes can also be given. Areas of future development will be indicated.