Schedule

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1979
Monday, January 1st
12:00 AM

Characterization of Surface Wave Scattering by Surface Breaking Cracks

S Ayter, Stanford University
B A. Auld, Stanford University

La Jolla, CA

12:00 AM

Review of Crack Depth Measurement by Ultrasonics

P A. Doyle, Aeronautical Research Laboratories
C M. Scala, Aeronautical Research Laboratories

La Jolla, CA

12:00 AM

Scattering of Ultrasound (Including Rayleigh Waves) by Surface Roughness and by Single Surface Flaws. A Review of the Work Done at Paris 7 University

G Quentin, Université Paris VII
M de Billy, Université Paris VII
A Jungman, Université Paris VII
Bernard R. Tittmann, Rockwell International

La Jolla, CA

12:00 AM

Surface Crack Characterization: Geometry and Stress Intensity Factor Measurements

B T. Khuri-Yakub, Stanford University
Gordon S. Kino, Stanford University
J C. Shyne, Stanford University
V Domarkas, Stanford University

La Jolla, CA

12:00 AM

Surface Wave Scattering from Elliptical Cracks for Failure Prediction

Bernard R. Tittmann, Rockwell International
Otto Buck, Rockwell International
L A. Ahlberg, Rockwell International
M de Billy, Université Paris VII
F Cohen-Tenoudji, Université Paris VII
A Jungman, Université Paris VII
G Quentin, Université Paris VII

La Jolla, CA

12:00 AM