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1979
Monday, January 1st
12:00 AM

A Comparison of Multiple Frequency and Pulsed Eddy Current Techniques

W E. Deeds, University of Tennessee - Knoxville

La Jolla, CA

12:00 AM

A Pseudorandom Binary Noise Ultrasonic System

C M. Elias, SRL, Inc.
T J. Moran, United States Air Force

La Jolla, CA

12:00 AM

A Technique for Determining Flaw Characteristics from Ultrasonic Scattering Amplitudes

J H. Rose, Cornell University
J A. Krumhansl, Cornell University

La Jolla, CA

12:00 AM

Accept/Reject Criteria for Structural Ceramics: A Computer Simulation of Nondestructive Reliability in Ceramics

G Meyer, Rockwell International
K Fertig, Rockwell International
J Richardson, Rockwell International
A G. Evans, University of California - Berkeley

La Jolla, CA

12:00 AM

Accept/Reject Criteria for Structural Ceramics: Probablistic Models for Inclusion Initiated Fracture in Ceramics

A G. Evans, University of California - Berkeley
B I. Davis, Rockwell International
G Meyer, Rockwell International
H R. Baumgartner, Norton Co.

La Jolla, CA

12:00 AM

Accept/Reject Criteria for Structural Ceramics: Some Effects of Cavities in the Fracture of Ceramics - Spherical Cavities

A G. Evans, Rockwell International
D R. Biswas, University of California - Berkeley
R M. Fulrath, University of California - Berkeley

La Jolla, CA

12:00 AM

Accept/Reject Criteria for Structural Ceramics: Some Effects of Cavities on the Fracture of Ceramics - Cylindrical Holes

A G. Evans, Rockwell International
D R. Biswas, University of California - Berkeley
R M. Fulrath, University of California - Berkeley

La Jolla, CA

12:00 AM

Acoustic Emission in Composites Using MPA

Lloyd J. Graham, Rockwell International

La Jolla, CA

12:00 AM

Acoustic Emission Multi-Parameter Analyzer—AEMPA

L J. Graham, Rockwell International
R Govan, Rockwell International
R K. Elsley, Rockwell International
G Lindberg, Rockwell International
R L. Randall, Rockwell International

La Jolla, CA

12:00 AM

Acoustic Emission Recording Using nonvolatile Digital Memories

James R. Skorpik, Pacific Northwest National Laboratory

La Jolla, CA

12:00 AM

Acoustic Imaging and Image Processing by Wavefront Reconstruction Techniques

Ken Lakin, University of Southern California

La Jolla, CA

12:00 AM

Acoustic Microscopy for Materials Characterization

A Atalar, Stanford University
V Jipson, Stanford University
C F. Quate, Stanford University

La Jolla, CA

12:00 AM

Adaptive Learning Network (ALN) Hardware

Anthony N. Mucciardi, Adaptronics, Inc.

La Jolla, CA

12:00 AM

Advanced EMAT Inspection Systems: Projectiles and Welds

C M. Fortunko, Rockwell International
R B. Thompson, Rockwell International

La Jolla, CA

12:00 AM

Annular Array Search Units and Their Potential Application in Conventional Ultrasonic Testing Systems

Jerry T. McElroy, Southwest Research Institute
Kenneth F. Briers, Southwest Research Institute

La Jolla, CA

12:00 AM

Application of Geometrical Diffraction Theory to QNDE Analysis

J D. Achenbach, Northwestern University
A K. Gautesen, Northwestern University
H McMaken, Northwestern University

La Jolla, CA

12:00 AM

Automatic Data Recording for Manual Ultrasonic Examinations

A R. Whiting, Southwest Research Institute

La Jolla, CA

12:00 AM

Balancing Technological Opportunities vs. Operational Requirements: an AFML Challenge

T J. Moran, United States Air Force

La Jolla, CA

12:00 AM

Beam Intensity Profiling Using Correlation Systems

E S. Furgason, Purdue University
G F. Johnson, Purdue University
B B. Lee, Purdue University

La Jolla, CA

12:00 AM

Calculation of Scattering by the Distorted Wave Born Approximation

Kathie E. Newman, University of Washington - Seattle Campus
Eytan Domany, University of Washington - Seattle Campus

La Jolla, CA

12:00 AM

Calculation of the Response of Angle Beam EMATs to Flaws in the Far Field

William J. Pardee, Rockwell International
R B. Thompson, Rockwell International

La Jolla, CA

12:00 AM

Canadian Forces In-Flight Acoustic Emission Monitoring Program

S L. McBride, Royal Military College of Canada

La Jolla, CA

12:00 AM

Capability of Determining Fatigue Mechanisms in 7075 Aluminum by Combining Ultrasonic Attenuation and Acoustic Emission Monitoring

J C. Duke Jr, Johns Hopkins University
R E. Green Jr, Johns Hopkins University

La Jolla, CA

12:00 AM

Characterization of Defects in Adhesive Bonds by Adaptive Learning Networks

Anthony N. Mucciardi, Adaptronics, Inc.
R K. Elsley, Rockwell International

La Jolla, CA

12:00 AM

Characterization of Surface Wave Scattering by Surface Breaking Cracks

S Ayter, Stanford University
B A. Auld, Stanford University

La Jolla, CA

12:00 AM

Crack Identification and Characterization in the Rayleigh Limit

J E. Gubernatis, Los Alamos Scientific Laboratory
Eytan Domany, University of Washington - Seattle Campus

La Jolla, CA

12:00 AM

Custom EMAT Instrumentation: Correlation Receiver and Flaw Detector

C F. Vasile

La Jolla, CA

12:00 AM

Defect Characterization in Ceramics Using High Frequency Ultrasonics

Gordon S. Kino, Stanford University
B T. Khuri-Yakub, Stanford University
Y Murakami, Stanford University
K H. Yu, Stanford University

La Jolla, CA

12:00 AM

Detection of Radial Bolt-Hole Cracks Using Sampled CW Ultrasonic Doppler-Shift Techniques

N K. Batra, Systems Research Laboratories, Inc.
J M. Raney, Systems Research Laboratories, Inc.
R M. Panos, United States Air Force

La Jolla, CA

12:00 AM

Digital Synthetic Aperture Acoustic Imaging for NDE

Gordon S. Kino, Stanford University
P M. Grant, Stanford University
P D. Corl, Stanford University
C S. DeSilets, Stanford University

La Jolla, CA

12:00 AM

Direct and Inverse Problems Pertaining to the Scattering of Elastic Waves in the Rayleigh (Long Wavelength) Regime

John M. Richardson, Rockwell International

La Jolla, CA

12:00 AM

Electrochemical Determination of Hydrogen in Steel

F Mansfeld, Rockwell International

La Jolla, CA

12:00 AM

Flaw Characterization by Low Frequency Scattering Measurements

R K. Elsley, Rockwell International

La Jolla, CA

12:00 AM

Flaw Detection and Characterization in Ceramics with the Scanning Laser Acoustic Microscope (SLAM)

D E. Yuhas, Sonoscan, Inc.
L W. Kessler, Sonoscan, Inc.

La Jolla, CA

12:00 AM

Frequency Dependence of Ultrasonic Wave Scattering from Cracks

Laszlo Adler, University of Tennessee - Knoxville
Kent Lewis, University of Tennessee - Knoxville

La Jolla, CA

12:00 AM

Imaging and Characterization of Thick Production-Line Microelectronic Components using Transmission Acoustic Microscopy

Chen S. Tsai, Carnegie Mellon University
Jung K. Wang, Carnegie Mellon University
Chin C. Lee, Carnegie Mellon University

La Jolla, CA

12:00 AM

Initiation and Display of Delamination Failure During Fatigue of Graphite Fiber-Epoxy Composites

W L. Morris, Rockwell International

La Jolla, CA

12:00 AM

Inspection of Ceramics Incorporating Size Estimation Methods Using Conventional Ultrasonics

George A. Alers, Rockwell International
R C. Addison Jr, Rockwell International
L A. Ahlberg, Rockwell International

La Jolla, CA

12:00 AM

Integrated Ultrasonic Transducer

Richard M. White, University of California - Berkeley
Sze-Hon Kwan, University of California - Berkeley
Kent Chuang, University of California - Berkeley
Richard S. Muller, University of California - Berkeley

La Jolla, CA

12:00 AM

International NDE Effort: Future Directions

Michael Buckley, United States Department of Defense

La Jolla, CA

12:00 AM

Inversion of Physically Recorded Ultrasonic Waveforms Using Adaptive Learning Network Models Trained on Theoretical Data

M F. Whalen, Adaptronics, Inc.
Anthony N. Mucciardi, Adaptronics, Inc.

La Jolla, CA

12:00 AM

Laser Photoacoustic Technique for NDE

Y H. Wong, Wayne State University
R L. Thomas, Wayne State University

La Jolla, CA

12:00 AM

Long Wavelength Defect Evaluation

J R. Rice, Brown University

La Jolla, CA

12:00 AM

Microfocus X-Ray and Image Enhancement of Ceramics

J J. Schuldies, AiResearch Manufacturing Co.

La Jolla, CA

12:00 AM

Microwave NDE of Ceramics

A J. Bahr, SRI International

La Jolla, CA

12:00 AM

Moisture Diffusion Analysis for Composite Microdamage

C L. Leung, Rockwell International

La Jolla, CA

12:00 AM

Multifrequency Eddy Current Inspection with Continuous Wave Methods

T J. Davis, Pacific Northwest National Laboratory

La Jolla, CA

12:00 AM

New EMAT Applications: Ultrasonic Ellipsometer and Detection of Cracks under Fasteners

R B. Thompson, Rockwell International
C F. Vasile, Rockwell International

La Jolla, CA

12:00 AM

Nondestructive Detection of Voids by a High Frequency Technique

Jack K. Cohen, Denver Applied Analytics
Norman Bleistein, Denver Applied Analytics
Richard K. Elsley, Rockwell International

La Jolla, CA

12:00 AM

Nondestructive Inspection of High Performance Ceramics

R H. Brockelman, United States Army

La Jolla, CA

12:00 AM

Optical Measurement of Acoustic Emission at High and Low Temperatures

C Harvey Palmer, Johns Hopkins University

La Jolla, CA

12:00 AM

Optimization of Scattering Matrix for Elastic Waves from Voids and Obstacles

William M. Visscher, Los Alamos Scientific Laboratory

La Jolla, CA

12:00 AM

Overview and Purpose

Anthony G. Evans, Rockwell International

La Jolla, CA

12:00 AM

Overview of Planned Ultrasonic Imaging System with Automatic ALN Data Interpretation

Anthony N. Mucciardi, Adaptronics, Inc.
S S. Lane, Adaptronics, Inc.
G J. Posakony, Pacific Northwest National Laboratory

La Jolla, CA

12:00 AM

Overview of Quantitative NDE

R B. Thompson, Rockwell International

La Jolla, CA

12:00 AM

Polymer Composite Reliability

David H. Kaelble, Rockwell International

La Jolla, CA

12:00 AM

Preface

Donald O. Thompson, Rockwell International

La Jolla, CA

12:00 AM

Preliminary Evaluation of NDE Techniques for Structural Ceramics

D S. Kupperman, Argonne National Laboratory
A Sather, Argonne National Laboratory
N P. Lapinski, Argonne National Laboratory
C Sciammarella, Argonne National Laboratory
D Yuhast, Argonne National Laboratory

La Jolla, CA

12:00 AM

Purpose and Progress of Quantitative NDE

D O. Thompson, Rockwell International

La Jolla, CA

12:00 AM

PVF2 Transducers for NDE

W H. Chen, Stanford University
H J. Shaw, Stanford University
D G. Weinstein, Stanford University
L T. Zitelli, Stanford University

La Jolla, CA

12:00 AM

Quantitative Measurement of Crack Parameters Using Microwave Eddy-Current Techniques

A J. Bahr, SRI International

La Jolla, CA

12:00 AM

Quantitative Ultrasonic Holographic Defect Characterization

J W. Brophy, Babcock & Wilcox Company
A E. Holt, Babcock & Wilcox Company
J H. Flora, Babcock & Wilcox Company

La Jolla, CA

12:00 AM

Real Tiime CCD Averager for Ultrasonic Applications

Earl DuNack, General Dynamics
William McCabe, General Dynamics

La Jolla, CA

12:00 AM

Retrospective Comments on the Elastic Wave Scattering Problem

J A. Krumhansl, Cornell University

La Jolla, CA

12:00 AM

Review of Crack Depth Measurement by Ultrasonics

P A. Doyle, Aeronautical Research Laboratories
C M. Scala, Aeronautical Research Laboratories

La Jolla, CA

12:00 AM

Scattering of Ultrasound (Including Rayleigh Waves) by Surface Roughness and by Single Surface Flaws. A Review of the Work Done at Paris 7 University

G Quentin, Université Paris VII
M de Billy, Université Paris VII
A Jungman, Université Paris VII
Bernard R. Tittmann, Rockwell International

La Jolla, CA

12:00 AM

State of the Art in Single Frequency Eddy Current Testing

K J. Law, K.J. Law Engineers, Inc.

La Jolla, CA

12:00 AM

Summary Discussion

Robb Thompson, National Bureau of Standards

La Jolla, CA

12:00 AM

Surface Contamination: NDE Mapping and Effects on Bond Strength

Tennyson Smith, Rockwell International

La Jolla, CA

12:00 AM

Surface Crack Characterization: Geometry and Stress Intensity Factor Measurements

B T. Khuri-Yakub, Stanford University
Gordon S. Kino, Stanford University
J C. Shyne, Stanford University
V Domarkas, Stanford University

La Jolla, CA

12:00 AM

Surface Flaw Detection with Ferromagnetic Resonance Probes

B A. Auld, Stanford University
G Elston, Stanford University
D K. Winslow, Stanford University
C M. Fortunko, Rockwell International

La Jolla, CA

12:00 AM

Surface Wave Scattering from Elliptical Cracks for Failure Prediction

Bernard R. Tittmann, Rockwell International
Otto Buck, Rockwell International
L A. Ahlberg, Rockwell International
M de Billy, Université Paris VII
F Cohen-Tenoudji, Université Paris VII
A Jungman, Université Paris VII
G Quentin, Université Paris VII

La Jolla, CA

12:00 AM

T-Matrix Calculations for Spheroidal and Crack Like Flaws

Vasundara V. Varadan, Ohio State University
Vijay K. Varadan, Ohio State University

La Jolla, CA

12:00 AM

Test Bed Concept as a Means of Introducing New Technology

A L. Thompson, General Electric
E E. Weismantel, General Electric
D M. Comassar, General Electric

La Jolla, CA

12:00 AM

Test Bed for Quantitative NDE

R C. Addison Jr, Rockwell International

La Jolla, CA

12:00 AM

The Application of Finite Element Method Analysis to Eddy Current NDE

T G. Kincaid, General Electric
M V. K Chari, General Electric

La Jolla, CA

12:00 AM

The DARPA Investment Strategy in Quantitative NDE

Michael J. Buckley, United States Air Force

La Jolla, CA

12:00 AM

The Impact of Inspection and Analysis Uncertainty on Reliability Prediction and Life Extension Strategy

Charles A. Rau Jr, Failure Analysis Associates

La Jolla, CA

12:00 AM

The Importance of Nondestructive Evaluation to Future Energy Systems

James S. Kane, United States Department of Energy

La Jolla, CA

12:00 AM

The Use of Noise Signals for Multi-Mode Beam Shaping

E S. Furgason, Purdue University
V L. Newhouse, Purdue University
B B. Lee, Purdue University

La Jolla, CA

12:00 AM

Ultrasonic Evaluation of Adhesive Bond Strength Using Spectroscopic Techniques

F H. Chang, General Dynamics
R A. Kline, General Dynamics
J R. Bell, General Dynamics

La Jolla, CA

12:00 AM

Ultrasonic Imaging Project and Test Bed

B J. McKinley, University of California

La Jolla, CA

12:00 AM

Ultrasonic Measurement of Interfacial Properties in Completed Adhesive Bonds

George A. Alers, Rockwell International
R K. Eksley, Rockwell International
John M. Richardson, Rockwell International
K Fertig, Rockwell International

La Jolla, CA

12:00 AM

Ultrasonic Measurements of Inhomogenous Stress Fields

G Hermann, Stanford University
Gordon S. Kino, Stanford University

La Jolla, CA

12:00 AM

Ultrasonic Testing - Reconstruction of Reflectors from Time-Delay and Amplitude-Locus Curves

P Höller, Institut für Zerstörungsfreie Prüfverfahren
O A. Barbian, Institut für Zerstörungsfreie Prüfverfahren
R Werneyer, Institut für Zerstörungsfreie Prüfverfahren

La Jolla, CA

12:00 AM

Vibrothermography and Ultrasonic Pulse-Echo Methods Applied to the Detection of Damage in Composite Lamintates

Edmund G. Henneke II, Virginia Polytechnic Institute and State University
Kenneth L. Reifsnider, Virginia Polytechnic Institute and State University
Wayne W. Stinchcomb, Virginia Polytechnic Institute and State University

La Jolla, CA

12:00 AM

Visualization of Transducer-Produced Sound Fields in Solids

Wolfgang Sachse, Cornell University

La Jolla, CA

12:00 AM