Microfocus X-Ray and Image Enhancement of Ceramics
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Begun in 1973, the Review of Progress in Quantitative Nondestructive Evaluation (QNDE) is the premier international NDE meeting designed to provide an interface between research and early engineering through the presentation of current ideas and results focused on facilitating a rapid transfer to engineering development.
This site provides free, public access to papers presented at the annual QNDE conference between 1983 and 1999, and abstracts for papers presented at the conference since 2001.
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Abstract
Microfocus X-ray and image enhancement techniques were applied to hot-pressed silicon nitride test specimens containing selected subsurface defects. These NDE techniques are being investigated to determine their defect characterization capabilities in various ceramic material systems. Illustrations are presented of defect detection limitations for microfocus X-ray which are primarily associated with low radiographic contrast between defect and parent material. Examples are also shown of defect detectability and geometric sharpness obtained.in ceramic test specimens containing inclusions of high and low density with respect to the parent material.