Location

La Jolla, CA

Start Date

1979 12:00 AM

Description

A high frequency A-scan system (150-450 MHz longitudinal, 150-300 MHz shear) has been used to characterize defects in ceramics. An Indium bonding technology has been developed to make broadband, and efficient transducers. Defect characterization is done by comparing the time domain backscattered signals from defects to theory. A Wiener filter is used in order to correct the response of the transducer and the propagating medium, and thus give the impulse response of real defects. A good agreement between theory and experiment is obtained for inclusions such as voids, WC, and SiC in Si3N4.

Book Title

Proceedings of the ARPA/AFML Review of Progress in Quantitative NDE

Chapter

7. NDE for Advanced Materials

Pages

242-245

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Defect Characterization in Ceramics Using High Frequency Ultrasonics

La Jolla, CA

A high frequency A-scan system (150-450 MHz longitudinal, 150-300 MHz shear) has been used to characterize defects in ceramics. An Indium bonding technology has been developed to make broadband, and efficient transducers. Defect characterization is done by comparing the time domain backscattered signals from defects to theory. A Wiener filter is used in order to correct the response of the transducer and the propagating medium, and thus give the impulse response of real defects. A good agreement between theory and experiment is obtained for inclusions such as voids, WC, and SiC in Si3N4.