Location

La Jolla, CA

Start Date

1979 12:00 AM

Description

An acoustic microscope with mechanical scanning and piezoelectric film transducers for the input and output has been developed for the microscopic examination of materials.1 In the reflection mode it is possible to work with an acoustic wavelength of 0.5 micrometers and a resolution that compares to that of the optical microscope. The elastic images of material surfaces as recorded with this instrument display interesting features which provide information which complements the optical microscope. In particular we find that different phases show up with good contrast and in alloy material the texture of the grains can be recorded since the grain orientation influences the acoustic reflectivity.

Book Title

Proceedings of the ARPA/AFML Review of Progress in Quantitative NDE

Chapter

7. NDE for Advanced Materials

Pages

252-256

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Acoustic Microscopy for Materials Characterization

La Jolla, CA

An acoustic microscope with mechanical scanning and piezoelectric film transducers for the input and output has been developed for the microscopic examination of materials.1 In the reflection mode it is possible to work with an acoustic wavelength of 0.5 micrometers and a resolution that compares to that of the optical microscope. The elastic images of material surfaces as recorded with this instrument display interesting features which provide information which complements the optical microscope. In particular we find that different phases show up with good contrast and in alloy material the texture of the grains can be recorded since the grain orientation influences the acoustic reflectivity.