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1980
Tuesday, January 1st
12:00 AM

Acoustic Surface Wave Probing of Ceramics

J Tien, Stanford University
B T. Khuri-Yakub, Stanford University
Gordon S. Kino, Stanford University

La Jolla, CA

12:00 AM

Characterization of Defects and Heterogeneities in Silicon Nitride and Silicon Carbide by Different NDE Methods

K Goebbels, Fraunhofer-lnstitut für zerstörungsfreie Prüfverfahren
H Reiter, Fraunhofer-lnstitut für zerstörungsfreie Prüfverfahren

La Jolla, CA

12:00 AM

Conditional Probability of Failure and Accept/Reject Criteria

John M. Richardson, Rockwell International
K W. Fertig, Rockwell International
A G. Evans, University of California - Berkeley

La Jolla, CA

12:00 AM

Differentiation of Various Flaw Types in Ceramics Using the Scanning Laser Acoustic Microscope

D E. Yuhas, Sonoscan, Inc.
T E. McGraw, Sonoscan, Inc.
L W. Kessler, Sonoscan, Inc.

La Jolla, CA

12:00 AM

High-Frequency Bulk Wave Measurements of Structural Ceramics

C H. Chou, Stanford University
B T. Khuri-Yakub, Stanford University
K Liang, Stanford University
Gordon S. Kino, Stanford University

La Jolla, CA

12:00 AM

Long Wave Ultrasonic Characterization of Inclusions in Silicon Nitride

L A. Ahlberg, Rockwell International
Richard K. Elsley, Rockwell International
Lloyd J. Graham, Rockwell International
John M. Richardson, Rockwell International

La Jolla, CA

12:00 AM

Nondestructive Evaluation Techniques for Silicon Carbide Heat-Exchanger Tubing

D S. Kupperman, Argonne National Laboratory
W D. Deininger, Argonne National Laboratory
N P. Lapinski, Argonne National Laboratory
C Sciammarella, Argonne National Laboratory
D Yuhast, Argonne National Laboratory

La Jolla, CA

12:00 AM

Probabilistic Models for Defect Initiated Fracture in Ceramics

A G. Evans, University of California - Berkeley
M E. Meyer, Rockwell International
K W. Fertig, Rockwell International
B I. Davis, Rockwell International
H R. Baumgartner, Norton Co.

La Jolla, CA

12:00 AM

Scanning Laser Acoustic Microscope Visualization of Solid Inclusions in Silicon Nitride

D E. Yuhas, Sonoscan, Inc.
T E. McGraw, Sonoscan, Inc.
L W. Kessler, Sonoscan, Inc.

La Jolla, CA

12:00 AM

Structural and Microstructural Design in Brittle Materials

A G. Evans, University of California - Berkeley

La Jolla, CA

12:00 AM

Ultrasonic Detection of Surface Flaws in Gas Turbine Ceramics

Thomas Derkacs, Thompson-Ramo-Wooldridge
I M. Matay, Thompson-Ramo-Wooldridge

La Jolla, CA

12:00 AM