Location

La Jolla, CA

Start Date

1980 12:00 AM

Description

A 50 MHz C-scan imaging system is under construction for fast defect detection. A high-frequency (150-450 MHz) A-scan system is used for host material evaluation, and defect characterization. Several signal processing schemes such as time and space averaging, Wiener filtering, diffraction and propagation loss corrections are used in the process of defect characterization. Further modifications of the exact theory of scattering from spherical inclusions are made to ease the process of defect identification.

Book Title

Proceedings of the ARPA/AFML Review of Progress in Quantitative NDE

Chapter

15. Failure Modes, Defect Characterization, and Accept/Reject Criteria

Pages

663-670

Language

en

File Format

application/pdf

Share

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Jan 1st, 12:00 AM

High-Frequency Bulk Wave Measurements of Structural Ceramics

La Jolla, CA

A 50 MHz C-scan imaging system is under construction for fast defect detection. A high-frequency (150-450 MHz) A-scan system is used for host material evaluation, and defect characterization. Several signal processing schemes such as time and space averaging, Wiener filtering, diffraction and propagation loss corrections are used in the process of defect characterization. Further modifications of the exact theory of scattering from spherical inclusions are made to ease the process of defect identification.