Location

La Jolla, CA

Start Date

1980 12:00 AM

Description

The Reflection Acoustic Microscope, operating at a microwave frequency near 400 MHz, has been used to image and examine subsurface detail in a multilayer ceramic chip capacitor (MCCC). Bulk examination of the 0.9 mm thick MCCC is at present not possible with this high resolution acoustic microscope because of the short depth of focus of the particular lens designed for the system and because of the short wavelength ( w 4 m).

Book Title

Proceedings of the ARPA/AFML Review of Progress in Quantitative NDE

Chapter

7. Non Metallic NDE, Acoustic Microscopy

Pages

253

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Nondestructive Subsurface Imaging with the Reflection Acoustic Microscope

La Jolla, CA

The Reflection Acoustic Microscope, operating at a microwave frequency near 400 MHz, has been used to image and examine subsurface detail in a multilayer ceramic chip capacitor (MCCC). Bulk examination of the 0.9 mm thick MCCC is at present not possible with this high resolution acoustic microscope because of the short depth of focus of the particular lens designed for the system and because of the short wavelength ( w 4 m).