Location

La Jolla, CA

Start Date

1980 12:00 AM

Description

Recent progress on diagnosis and characterization of defects in hybrid microelectronic components us1ng a transmission scanning acoustic microscope (SAM) operating at 150 MHz is summarized. A simple method has been established to locate (in three dimensions) and classify the defects. The study also shows that two optically identical thick-film resistors having a ratio of 5 x 103 in resistance value exhibit a 43 db contrast in acoustic amplitude

Book Title

Proceedings of the ARPA/AFML Review of Progress in Quantitative NDE

Chapter

7. Non Metallic NDE, Acoustic Microscopy

Pages

247-252

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Further Progress on Nondestructive Diagnosis of Hybrid Microelectronic Components Using Transmission Acoustic Microscopy

La Jolla, CA

Recent progress on diagnosis and characterization of defects in hybrid microelectronic components us1ng a transmission scanning acoustic microscope (SAM) operating at 150 MHz is summarized. A simple method has been established to locate (in three dimensions) and classify the defects. The study also shows that two optically identical thick-film resistors having a ratio of 5 x 103 in resistance value exhibit a 43 db contrast in acoustic amplitude