Schedule

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1981
Thursday, January 1st
12:00 AM

Application of Adaptive Learning Networks to Quantitative Flaw Definition

M F. Whalen, Adaptronics, Inc.
P M. Garafola, Adaptronics, Inc.
L J. O'Brien, Adaptronics, Inc.
Anthony N. Mucciardi, Adaptronics, Inc.

La Jolla, CA

12:00 AM

Dependence of the Accuracy of the Born Inversion on Noise and Bandwidth

Richard K. Elsley, Rockwell International
R C. Addison Jr, Rockwell International

La Jolla, CA

12:00 AM

Sensitivity of Failure Prediction to Flaw Geometry

John M. Richardson, Rockwell International
R Chang, Rockwell International
K W. Fertig, Rockwell International
Vasundara V. Varadan, Ohio State University

La Jolla, CA

12:00 AM

Time Domain Born Approximation

J H. Rose, Iowa State University
John M. Richardson, Rockwell International

La Jolla, CA

12:00 AM

Ultrasonic Flaw Characterization in the Resonance Region by the Boundary Integral Equation Method

Lester W. Schmerr Jr., Iowa State University
C. Sieck, Iowa State University

La Jolla, CA

12:00 AM