Location

La Jolla, CA

Start Date

1981 12:00 AM

Description

In an attempt to expand the scope of electromagnetic testing to include poorly conducting materials, we have tried using a low frequency capacitive probe. This probe has given promising performances in testing materials with resistivities of several hundred ohm-centimeters.

Book Title

Proceedings of the ARPA/AFML Review of Progress in Quantitative NDE

Chapter

16. Applications

Pages

556-562

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Using Capacitive Probes in Electromagnetic Nondestructive Testing

La Jolla, CA

In an attempt to expand the scope of electromagnetic testing to include poorly conducting materials, we have tried using a low frequency capacitive probe. This probe has given promising performances in testing materials with resistivities of several hundred ohm-centimeters.