Location

La Jolla, CA

Start Date

1981 12:00 AM

Description

Recent advances in scanning photoacoustic microscopy (SPAM) for NDE are described. Conventional and phase-contrast modes are used to detect a well-characterized subsurface flaw in Al, and the results are shown to be in good agreement with calculations based upon a three-dimensional thermal diffusion model. Applications of the technique are given which demonstrate surface and subsurface flaw detection in complex-shaped ceramic turbine parts. Photoacoustic pictures are presented of an integrated circuit semiconductor chip and show 6 μm resolution.

Book Title

Proceedings of the ARPA/AFML Review of Progress in Quantitative NDE

Chapter

8. Ultrasonic Imaging and Microscope

Pages

236-238

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Photoacoustic Microscopy

La Jolla, CA

Recent advances in scanning photoacoustic microscopy (SPAM) for NDE are described. Conventional and phase-contrast modes are used to detect a well-characterized subsurface flaw in Al, and the results are shown to be in good agreement with calculations based upon a three-dimensional thermal diffusion model. Applications of the technique are given which demonstrate surface and subsurface flaw detection in complex-shaped ceramic turbine parts. Photoacoustic pictures are presented of an integrated circuit semiconductor chip and show 6 μm resolution.