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1981
Thursday, January 1st
12:00 AM

Defect Classification and Imaging with Phase Array Techniques

V Schmitz, Fraunhofer Institut für zerstoerungsfreire Pruefverfahren
W Gebhardt, Fraunhofer Institut für zerstoerungsfreire Pruefverfahren
F Bonitz, Fraunhofer Institut für zerstoerungsfreire Pruefverfahren

La Jolla, CA

12:00 AM

Scanned Imaging Techniques for Surface NDE

S Ameri, University College London
E A. Ash, University College London
C R. Petts, University College London
H K. Wickramasinghe, University College London

La Jolla, CA

12:00 AM

The Application of Ultrasonics in Non-Destructive Testing: A Review of Some of the Research at University College London

M D. Ambersley, University College London
Leonard J. Bond, University College London
A L. Downie, University College London
W Duerr, University College London
C W. Pitt, University College London
D A. Sinclair, University College London
I R. Smith, University College London

La Jolla, CA

12:00 AM