Schedule

Subscribe to RSS Feed

1983
Saturday, January 1st
12:00 AM

Defect Characterization of a Multifrequency Eddy Current System

K. Betzold, Fraunhofer-Institut für zerstörungsfreie Prüfverfahren

La Jolla, CA

12:00 AM

Development of a System to Invert Eddy-Current Data and Reconstruct Flaws

L. David Sabbagh, Analytics, Inc.
Harold A. Sabbagh, Analytics, Inc.

La Jolla, CA

12:00 AM

Eddy-Current Imaging for Defect Characterization

David C. Copley, General Electric Company

La Jolla, CA

12:00 AM

Inversion of Eddy Current Signals in a Nonuniform Probe Field

F. Muennemann, Stanford University
B. A. Auld, Stanford University
C. M. Fortunko, National Bureau of Standards
S. A. Padget, National Bureau of Standards

La Jolla, CA

12:00 AM