Location

La Jolla, CA

Start Date

1-1-1983 12:00 AM

Description

X-ray analysis has traditionally been wavelength dispersive, manpower intensive, and an analytical laboratory tool employing massive and costly x-ray generators and diffraction spectrometers. Following the development of the lithium drifted silicon and germanium [Si(Li) and Ge(Li)] semiconductor radiation detectors in the mid 1960’s, and more recently the high purity germanium detector [HPGe], the analytical technique of energy dispersive x-ray fluorescence analysis (XRFA)1matured during the 1970’s.

Book Title

Review of Progress in Quantitative Nondestructive Evaluation

Volume

2B

Chapter

Section 21: Engineering Applications and Material Properties

Pages

1467-1471

DOI

10.1007/978-1-4613-3706-5_98

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Energy Dispersive K X-Ray Fluorescence Analysis for On-Line Process Control of Heavy Metal Concentrations

La Jolla, CA

X-ray analysis has traditionally been wavelength dispersive, manpower intensive, and an analytical laboratory tool employing massive and costly x-ray generators and diffraction spectrometers. Following the development of the lithium drifted silicon and germanium [Si(Li) and Ge(Li)] semiconductor radiation detectors in the mid 1960’s, and more recently the high purity germanium detector [HPGe], the analytical technique of energy dispersive x-ray fluorescence analysis (XRFA)1matured during the 1970’s.