Schedule

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1986
Wednesday, January 1st
12:00 AM

Acoustic Microscopy Applied to Acoustic Resonator Characterization

Section: Sensors

L. Germain, Université de Sherbrooke
J. D. N. Cheeke, Université de Sherbrooke

Williamsburg, VA

12:00 AM

An Examination of the Application of Wiener Filtering to Ultrasonic Scattering Amplitude Estimation

Section: Signal Processing

Steve Neal, Iowa State University
Donald O. Thompson, Iowa State University

Williamsburg, VA

12:00 AM

Application of Digital Pulse Shaping by Least Squares Method to Ultrasonic Signals in Composites

Section: Signal Processing

Doron Kishoni, National Aeronautics and Space Administration

Williamsburg, VA

12:00 AM

Application of Gel Electrode to Fatigue Testing of Aluminum Components

Section: Sensors

W. J. Baxter, General Motors

Williamsburg, VA

12:00 AM

Deconvolution for Acoustic Emission

Section: Signal Processing

J. A. Simmons, National Bureau of Standards and Technology

Williamsburg, VA

12:00 AM

Deep Thermoacoustic Imaging Using Scanning Electron Acoustic Microscopy

Section: Sensors

Richard M. White, University of California Berkeley

Williamsburg, VA

12:00 AM

Defect Detection with a Squid Magnetometer

Section: Sensors

Harold Weinstock, Illinois Institute of Technology
M. Nisenoff, United States Department of Defense

Williamsburg, VA

12:00 AM

Electromagnetic Sensor Arrays— Experimental Studies

Section: Sensors

A. J. Bahr, SRI International

Williamsburg, VA

12:00 AM

Electromagnetic Sensor Arrays—Theoretical Studies

Section: Sensors

B. A. Auld, Stanford University
J. Kenney, Stanford University
T. Lookabaugh, Stanford University

Williamsburg, VA

12:00 AM

Energy Shadowing Correction of Ultrasonic Pulse-Echo Records by Digital Signal Processing

Section: Signal Processing

Doron Kinoshi, National Aeronautics and Space Administration
Joseph S. Heyman, National Aeronautics and Space Administration

Williamsburg, VA

12:00 AM

Evaluation of Signal Processing Schemes in Ultrasonic Grain Size Estimation

Section: Signal Processing

Jafar Saniie, Illinois Institute of Technology
Daniel T. Nagle, Illinois Institute of Technology
Nihat M. Bilgutay, Drexel University

Williamsburg, VA

12:00 AM

Fiber Acoustic Waveguide : A Sensor Candidate

Section: Sensors

C. K. Jen, National Bureau of Standards and Technology
A. Safaai-Jazi, McGill University
G. W. Farnell, McGill University
E. L. Adler, McGill University

Williamsburg, VA

12:00 AM

High Frequency Transducer Development for Ultrasonic Tests on Ceramic Components

Section: Sensors

Narendra D. Patel, McMaster University
Jan van den Andel, McMaster University
Patrick S. Nicholson, McMaster University

Williamsburg, VA

12:00 AM

Mapping of Eddy Current Probe Fields

Section: Sensors

T. E. Capobianco, National Bureau of Standards and Technology
F. R. Fickett, National Bureau of Standards and Technology
John C. Moulder, National Bureau of Standards and Technology

Williamsburg, VA

12:00 AM

New Approaches to Ultrasonic Flaw Classification Using Signal Processing, Modeling, and Artificial Intelligence Concepts

Section: Signal Processing

Lester W. Schmerr Jr., Iowa State University

Williamsburg, VA

12:00 AM

Noncontact Material Testing Using Low-Energy Optical Generation and Detection of Acoustic Pulses

Section: Sensors

E. Bourkoff, Johns Hopkins University
C. Harvey Palmer, Johns Hopkins University

Williamsburg, VA

12:00 AM

Nondestructive Evaluation and Materials Characterization Using Photothermal-Optical-Beam-Deflection Imaging

Section: Sensors

G. C. Wetsel Jr., Southern Methodist University
J. W. Maclachlan, Johns Hopkins University
J. B. Spicer, Johns Hopkins University
J. C. Murphy, Johns Hopkins University

Williamsburg, VA

12:00 AM

Recent Results in Nondestructive Testing with Electromagnetic Ultrasonic Transducers

Section: Sensors

H. J. Salzburger, Universität Saarbrücken

Williamsburg, VA

12:00 AM

Sensitive Laser Interferometer for Acoustic Emission and Ultrasonic NDE

Section: Sensors

C. Harvey Palmer, Johns Hopkins University

Williamsburg, VA

12:00 AM

The Development and Characterization of Magnetostrictive Transducers

Section: Sensors

R. G. White, Loughborough University of Technology
D. C. Emmony, Loughborough University of Technology

Williamsburg, VA

12:00 AM

Time and Frequency Domain Measurements of Materials with High Ultrasonic Attenuation Using Time Delay Spectroscopy

Section: Signal Processing

Paul M. Gammell, National Aeronautics and Space Administration

Williamsburg, VA

12:00 AM

Ultrasonic Characterization of Lead Zirconate Titanate Ceramics

Section: Sensors

C. K. Jen, National Research Council of Canada
G. Shapiro, Almax Industries Ltd.
P. Cielo, National Research Council of Canada
J. F. Bussiere, National Research Council of Canada

Williamsburg, VA

12:00 AM

Ultrasonic Inspection of Partially Completed Welds Using Pattern Recognition Techniques

Section: Signal Processing

N. M. Carlson, EG&G Idaho, Inc.
J. A. Johnson, EG&G Idaho, Inc.

Williamsburg, VA

12:00 AM

Ultrasonic Sensors to Measure Internal Temperature Distribution

Section: Sensors

B. E. Droney, Bethlehem Steel Corporation
F. A. Mauer, National Bureau of Standards and Technology
S. J. Norton, National Bureau of Standards and Technology
Haydn N. G. Wadley, National Bureau of Standards and Technology

Williamsburg, VA

12:00 AM

Wideband Non-Contacting Ultrasonic Transducer

Section: Sensors

M. W. Godfrey, Loughborough University of Technology
D. C. Emmony, Loughborough University of Technology

Williamsburg, VA

12:00 AM