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1986
Wednesday, January 1st
12:00 AM

3-D X-Ray Computed Tomography

Section: Imaging and Reconstruction

L. A. Feldkamp, Ford Motor Company
G. Jesion, Ford Motor Company

Williamsburg, VA

12:00 AM

3-Dimensional Flaw Characterization Through 2-Dimensional Image Reconstructions

Section: Imaging and Reconstruction

K. C. Tam, General Electric

Williamsburg, VA

12:00 AM

A Computer-Aided Nondestructive Inspection System

Section: Systems

R. C. Addison Jr., Rockwell International
J. M. F. Lee, Rockwell International
A. H. Muir Jr., Rockwell International
A. W. Thiele, Rockwell International

Williamsburg, VA

12:00 AM

A Discussion of the Inverse Problem in Electromagnetic NDT

Section: Inversion

L. Udpa, Colorado State University
W. Lord, Colorado State University

Williamsburg, VA

12:00 AM

A Flaw Sizing Method Using the Zeroes in the Ultrasonic Scattering Amplitude

Section: Inversion

David K. Hsu, Iowa State University
Vladimir G. Kogan, Iowa State University
James H. Rose, Iowa State University
Donald O. Thompson, Iowa State University
Samuel J. Wormley, Iowa State University

Williamsburg, VA

12:00 AM

A Model for the Effects of Aberrations on Refracted Ultrasonic Fields

Section: Ultrasonics

R. Bruce Thompson, Iowa State University
E. F. Lopes, Iowa State University

Williamsburg, VA

12:00 AM

A Model of Pulsed Eddy Current Crack Detection

Section: Eddy Currents

R. E. Beissner, Southwest Research Institute
J. L. Fisher, Southwest Research Institute

Williamsburg, VA

12:00 AM

A Multifrequency Algorithm for Inverting Eddy-Current Data and Reconstructing Three-Dimensional Anomalies in Graphite-Epoxy

Section: Inversion

Harold A. Sabbagh, Sabbagh Associates, Inc.
L. David Sabbagh, Sabbagh Associates, Inc.
Thomas M. Roberts, Indiana University

Williamsburg, VA

12:00 AM

A Non-Contact Method for Automated Inspection of Nonconductive Coatings on Metallic Substrates

Section: Systems

D. J. Fischer, Martin Marietta Corporation
Glenn M. Cotty Jr., Martin Marietta Corporation

Williamsburg, VA

12:00 AM

A Perturbation Method for Inverse Scattering in Three-Dimensions Based on the Exact Inverse Scattering Equations

Section: Inversion

Brian DeFacio, University of Missouri
James H. Rose, Iowa State University

Williamsburg, VA

12:00 AM

Acoustic Emission: Nature's Ultrasound

Section: Other

Hadyn N. G. Wadley, National Bureau of Standards and Technology

Williamsburg, VA

12:00 AM

Acoustic Microscopy Applied to Acoustic Resonator Characterization

Section: Sensors

L. Germain, Université de Sherbrooke
J. D. N. Cheeke, Université de Sherbrooke

Williamsburg, VA

12:00 AM

An Assessment of Factors that Influence the Skin Depth in A.C.F.M. Crack Sizing

Section: Eddy Currents

M. C. Lugg, University College London
W. D. Dover, University College London
I. Kilpatrick, Admiralty Research Establishment
J. Cargill, Admiralty Research Establishment

Williamsburg, VA

12:00 AM

An Automatic Control and Data Logging System for the Determination of Magnetic Properties of Materials for Nondestructive Evaluation

Section: Systems

S. Habermehl, Iowa State University
David C. Jiles, Iowa State University

Williamsburg, VA

12:00 AM

An Examination of the Application of Wiener Filtering to Ultrasonic Scattering Amplitude Estimation

Section: Signal Processing

Steve Neal, Iowa State University
Donald O. Thompson, Iowa State University

Williamsburg, VA

12:00 AM

Application of Digital Pulse Shaping by Least Squares Method to Ultrasonic Signals in Composites

Section: Signal Processing

Doron Kishoni, National Aeronautics and Space Administration

Williamsburg, VA

12:00 AM

Application of Gel Electrode to Fatigue Testing of Aluminum Components

Section: Sensors

W. J. Baxter, General Motors

Williamsburg, VA

12:00 AM

Application of Uniform Field Eddy Current Technique to 3-D EDM Notches and Fatigue Cracks

Section: Eddy Currents

Eugene Smith, United Technologies Corporation

Williamsburg, VA

12:00 AM

Backscattering of Acoustic Signals from Inhomogenuities in Solids

Section: Ultrasonics

A. M. Buoncristiani, Christopher Newport College
B. T. Smith, Christopher Newport College

Williamsburg, VA

12:00 AM

Computerized Ultrasonic Test Inspection Enhancement System for Aircraft Components

Section: Systems

Ronald G. Parent, Lockheed-Georgia Company

Williamsburg, VA

12:00 AM

Contrast Mechanisms in the Thermoacoustic Microscope

Section: Imaging and Reconstruction

L. D. Favro, Wayne State University
P. K. Kuo, Wayne State University
R. L. Thomas, Wayne State University

Williamsburg, VA

12:00 AM

Deconvolution for Acoustic Emission

Section: Signal Processing

J. A. Simmons, National Bureau of Standards and Technology

Williamsburg, VA

12:00 AM

Deep Thermoacoustic Imaging Using Scanning Electron Acoustic Microscopy

Section: Imaging and Reconstruction

H. I. Ringermacher, United Technologies Corporation
L. Jackman, United Technologies Corporation

Williamsburg, VA

12:00 AM

Deep Thermoacoustic Imaging Using Scanning Electron Acoustic Microscopy

Section: Sensors

Richard M. White, University of California Berkeley

Williamsburg, VA

12:00 AM

Defect Detection with a Squid Magnetometer

Section: Sensors

Harold Weinstock, Illinois Institute of Technology
M. Nisenoff, United States Department of Defense

Williamsburg, VA

12:00 AM

Deterministic Source Inversion for Wave Propagation Problems in Nondestructive Testing

Section: Inversion

Jennifer E. Michaels, Cornell University

Williamsburg, VA

12:00 AM

Developments in the Finite Element Modeling of Ultrasonic NDT Phenomena

Section: Ultrasonics

R. Ludwig, Colorado State University
W. Lord

Williamsburg, VA

12:00 AM

Eddy Current Field Theory for a Flawed Conducting Half-Space

Section: Eddy Currents

John R. Bowler, University of Surrey

Williamsburg, VA

12:00 AM

Elastic Wave Scattering from an Interface Crack in A Layered Half Space under Water

Section: Ultrasonics

Sheryl M. Gracewski, University of Rochester
David B. Bogy, University of California Berkley

Williamsburg, VA

12:00 AM

Elastic Wave Scattering Methods: Assessments and Suggestions

Section: Ultrasonics

J. E. Gubernatis, Los Alamos National Laboratory

Williamsburg, VA

12:00 AM

Electromagnetic Sensor Arrays— Experimental Studies

Section: Sensors

A. J. Bahr, SRI International

Williamsburg, VA

12:00 AM

Electromagnetic Sensor Arrays—Theoretical Studies

Section: Sensors

B. A. Auld, Stanford University
J. Kenney, Stanford University
T. Lookabaugh, Stanford University

Williamsburg, VA

12:00 AM

Energy Shadowing Correction of Ultrasonic Pulse-Echo Records by Digital Signal Processing

Section: Signal Processing

Doron Kinoshi, National Aeronautics and Space Administration
Joseph S. Heyman, National Aeronautics and Space Administration

Williamsburg, VA

12:00 AM

Estimating Probability of Detection for Subsurface Ultrasonic Inspection

Section: Reliability

D. J. Sturges, General Electric
R. S. Gilmore, General Electric
P. W. Hovey, University of Dayton

Williamsburg, VA

12:00 AM

Evaluation of Captured Water Column Technology for Advanced Ultrasonic Sizing Techniques

Section: Systems

Glenn M. Light, Southwest Research Institute
W. R. van der Veer, Southwest Research Institute
David S. Stubbs, Systems Research Laboratory
Wally C. Hoppe, Systems Research Laboratory

Williamsburg, VA

12:00 AM

Evaluation of Signal Processing Schemes in Ultrasonic Grain Size Estimation

Section: Signal Processing

Jafar Saniie, Illinois Institute of Technology
Daniel T. Nagle, Illinois Institute of Technology
Nihat M. Bilgutay, Drexel University

Williamsburg, VA

12:00 AM

Evaluation of Ultrasonic Beam Models for the Case fo a Piston Transducer Radiating Through A Liquid-Solid Interface

Section: Ultrasonics

B. P. Newberry, Iowa State University
Timothy A. Gray, Iowa State University
E. F. Lopes, Iowa State University
R. Bruce Thompson, Iowa State University

Williamsburg, VA

12:00 AM

Fiber Acoustic Waveguide : A Sensor Candidate

Section: Sensors

C. K. Jen, National Bureau of Standards and Technology
A. Safaai-Jazi, McGill University
G. W. Farnell, McGill University
E. L. Adler, McGill University

Williamsburg, VA

12:00 AM

Fourier Descriptor Classification of Magnetite Buildup in Pwr Steam Generators

Section: Eddy Currents

S. S. Udpa, Colorado State University
W. Lord, Colorado State University

Williamsburg, VA

12:00 AM

Fundamental Limitations in Inverse Source and Scattering Problems in NDE

Section: Inversion

Anthony J. Devaney, Devaney Associates

Williamsburg, VA

12:00 AM

High Frequency Transducer Development for Ultrasonic Tests on Ceramic Components

Section: Sensors

Narendra D. Patel, McMaster University
Jan van den Andel, McMaster University
Patrick S. Nicholson, McMaster University

Williamsburg, VA

12:00 AM

High Frequency Ultrasonic Equipment for Detection of Submillimeter Flaws

Section: Systems

U. Opara, Krautkrämer GmbH

Williamsburg, VA

12:00 AM

High-Spatial-Resolution Computed Tomography for thin Annular Geometries

Section: Systems

R. J. Schneider, American Science and Engineering, Inc.
P. Burstein, American Science and Engineering, Inc.
F. H. Seguin, American Science and Engineering, Inc.
A. S. Krieger, American Science and Engineering, Inc.

Williamsburg, VA

12:00 AM

Image Enhancement via Extrapolation Techniques: A Two Dimensional Iterative Scheme a Direct Matrix Inversion Scheme

Section: Imaging and Reconstruction

L. David Sabbagh, Sabbagh Associates, Inc.
Harold A. Sabbagh, Sabbagh Associates, Inc.
James S. Klopfenstein, Sabbagh Associates, Inc.

Williamsburg, VA

12:00 AM

Imaging of Electromagnetic NDT Phenomena

Section: Imaging and Reconstruction

W. Lord, Colorado State University
L. Udpa, Colorado State University

Williamsburg, VA

12:00 AM

Imaging of Mechanically Induced Thermal Heat Patterns

Section: Imaging and Reconstruction

Edmund G. Henneke II, Virginia Polytechnic Institute and State University

Williamsburg, VA

12:00 AM

Imaging of Subsurface Artifacts with the Analytic Signal

Section: Imaging and Reconstruction

Z. W. Bell, Martin Marietta Corporation

Williamsburg, VA

12:00 AM

Improved Ultrasonic Methods for GAS Turbine NDE

Section: Ultrasonics

C. R. Gostelow, Royal Aircraft Establishment
R. L. Crocker, Fulmer Research Laboratories, Ltd.
N. Saffari, University College London
L. J. Bond, University College London

Williamsburg, VA

12:00 AM

Information Extraction from Multivariate Images

Section: Imaging and Reconstruction

S. K. Park, National Aeronautics and Space Administration
K. A. Kegley, National Aeronautics and Space Administration
J. R. Kegley, National Aeronautics and Space Administration

Williamsburg, VA

12:00 AM

Integration of Analytical Techniques into NDE Implementation and Management

Section: Reliability

Ward D. Rummel, Martin Marietta Corporation

Williamsburg, VA

12:00 AM

Ion-Acoustic Imaging of Surface Flaws in Aluminum

Section: Imaging and Reconstruction

F. G. Satkiewicz, Johns Hopkins University
J. C. Murphy, Johns Hopkins University
L. C. Aamodt, Johns Hopkins University
J. W. Maclachlan, Johns Hopkins University

Williamsburg, VA

12:00 AM

Manufacturing Technology for Nondestructive Evaluation (NDE) System to Implement Retirement for Cause (RFC) Procedures for GAS Turbine Engine Components

Section: Systems

Donald L. Birx, Systems Research Laboratories
Dena G. Doolin, Systems Research Laboratories

Williamsburg, VA

12:00 AM

Mapping of Eddy Current Probe Fields

Section: Sensors

T. E. Capobianco, National Bureau of Standards and Technology
F. R. Fickett, National Bureau of Standards and Technology
John C. Moulder, National Bureau of Standards and Technology

Williamsburg, VA

12:00 AM

Measurement of the Induced Magnetic Field in a Flawed Tube

Section: Eddy Currents

J. A. Nyenhuis, Purdue University
J. C. Treece, Purdue University
J. M. Drynan, Purdue University
H. A. Sabbagh, Sabbagh Associates, Inc.

Williamsburg, VA

12:00 AM

Micro-Computer Based Digital Image Processing Systems for Real-Time Radiography

Section: Systems

Paul Mengers, Quantex Corporation

Williamsburg, VA

12:00 AM

Microfocus X-Ray Technology — A Review of Developments and Application

R. W. Parish, Atomic Energy Research Establishment

Williamsburg, VA

12:00 AM

Modelling of the Leakage Induction Field Through Notches at Saturation

Section: Eddy Currents

B. de Halleux, Catholic University of Louvain
B. de Meester, Catholic University of Louvain
V. Hancart, Catholic University of Louvain

Williamsburg, VA

12:00 AM

New Approaches to Ultrasonic Flaw Classification Using Signal Processing, Modeling, and Artificial Intelligence Concepts

Section: Signal Processing

Lester W. Schmerr Jr., Iowa State University

Williamsburg, VA

12:00 AM

Noncontact Material Testing Using Low-Energy Optical Generation and Detection of Acoustic Pulses

Section: Sensors

E. Bourkoff, Johns Hopkins University
C. Harvey Palmer, Johns Hopkins University

Williamsburg, VA

12:00 AM

Nondestructive Evaluation and Materials Characterization Using Photothermal-Optical-Beam-Deflection Imaging

Section: Sensors

G. C. Wetsel Jr., Southern Methodist University
J. W. Maclachlan, Johns Hopkins University
J. B. Spicer, Johns Hopkins University
J. C. Murphy, Johns Hopkins University

Williamsburg, VA

12:00 AM

Numerical Calculations of Ultrasonic Field/Crack Interactions

Section: Ultrasonics

J. A. Johnson, EG&G Idaho, Inc.
D. M. Tow, EG&G Idaho, Inc.

Williamsburg, VA

12:00 AM

On the Accuracy of A.C. Flux Leakage, Eddy Current, EMAT and Ultrasonic Methods of Measuring Surface Connecting Flaws in Seamless Steel Tubing

Section: Eddy Currents

R. Palanisamy, Timken Company
C. J. Morris, Timken Company
D. M. Keener, Timken Company
M. N. Curran, Timken Company

Williamsburg, VA

12:00 AM

Optimizing Ultrasonic Signal Responses of Production Nondestructive Testing System

Section: Systems

Syed M. Ali, United States Department of Defense

Williamsburg, VA

12:00 AM

Performance of Large Scale Finite Element Eddy Current and Ultrasonic Models on a Vector Computer

Section: Eddy Currents

Nathan Ida, Akron University
Reinhold Ludwig, Colorado State University

Williamsburg, VA

12:00 AM

Practical Experiences with LSAFT

Section: Imaging and Reconstruction

V. Schmitz, Universität Saarbrücken
W. Müller, Universität Saarbrücken
G. Schäfer, Universität Saarbrücken

Williamsburg, VA

12:00 AM

Predictive Models and Reliability Improvement in Electromagnetic Nondestructive Evaluation

Section: Reliability

R. E. Beissner, Southwest Research Institute

Williamsburg, VA

12:00 AM

Pulsed Eddy-Current Crack-Characterization Experiments

Section: Eddy Currents

J. L. Fisher, Southwest Research Institute
R. E. Beissner, Southwest Research Institute

Williamsburg, VA

12:00 AM

Recent Results in Nondestructive Testing with Electromagnetic Ultrasonic Transducers

Section: Sensors

H. J. Salzburger, Universität Saarbrücken

Williamsburg, VA

12:00 AM

Reconstruction of Defect Geometries in Ultrasonic NDT

Section: Imaging and Reconstruction

V. Schmitz, Universität Saarbrücken
P. Höller, Universität Saarbrücken
K. J. Langenberg, University of Kassel

Williamsburg, VA

12:00 AM

Reconstruction of the Geometry of a Surface-Breaking Crack

Section: Imaging and Reconstruction

D. M. Tow, EG&G Idaho, Inc.

Williamsburg, VA

12:00 AM

Reflection and Transmission by an Array of Spherical Voids in an Elastic Solid

Section: Ultrasonics

Jan D. Achenbach, Northwestern University
M. Kitahara, Northwestern University

Williamsburg, VA

12:00 AM

RFC Automated Inspection Overview

Section: Systems

David A. Stubbs, Systems Research Laboratories
Wally C. Hoppe, Systems Research Laboratories

Williamsburg, VA

12:00 AM

RFC Eddy Current Probe Tests

Section: Systems

Wally C. Hoppe, Systems Research Laboratories
David A. Stubbs, Systems Research Laboratories

Williamsburg, VA

12:00 AM

Scattering of Elastic Waves by Small Surface-Breaking or Subsurface Cracks in Three Dimensions

Section: Ultrasonics

William M. Visscher, Los Alamos National Laboratory

Williamsburg, VA

12:00 AM

Scattering of Plane Waves by a Partially Closed Crack

Section: Ultrasonics

M. Punjani, University College London
L. J. Bond, University College London

Williamsburg, VA

12:00 AM

Semi-Elliptical Surface Flaw EC Interaction and Inversion: Experiment

Section: Inversion

John C. Moulder, National Bureau of Standards and Technology
J. C. Gerlitz, National Bureau of Standards and Technology
B. A. Auld, Stanford University
S. Jefferies, Stanford University

Williamsburg, VA

12:00 AM

Semi-Elliptical Surface Flaw EC Interaction and Inversion: Theory

Section: Inversion

B. A. Auld, Stanford University
S. Jefferies, Stanford University
John C. Moulder, National Bureau of Standards and Technolgoy
J. C. Gerlitz, National Bureau of Standards and Technology

Williamsburg, VA

12:00 AM

Sensitive Laser Interferometer for Acoustic Emission and Ultrasonic NDE

Section: Sensors

C. Harvey Palmer, Johns Hopkins University

Williamsburg, VA

12:00 AM

Separation of Spatial and Temporal Effects in an Ultrasonic Transducer

Section: Ultrasonics

Chung Chang, Cornell University
Wolfgang Sachse, Cornell University

Williamsburg, VA

12:00 AM

Surface Distributions for Eddy Current Probes

Section: Eddy Currents

D. H. Michael, University College London
P. G. Williams, University College London
F. Toufic, University College London
R. Collins, University College London

Williamsburg, VA

12:00 AM

The A.C.F.M. Technique: Recent Advances in Crack Depth Measurement

Section: Inversion

M. C. Lugg, University College London
W. D. Dover, University College London
D. R. Parramore, University College London

Williamsburg, VA

12:00 AM

The Development and Characterization of Magnetostrictive Transducers

Section: Sensors

R. G. White, Loughborough University of Technology
D. C. Emmony, Loughborough University of Technology

Williamsburg, VA

12:00 AM

The Effects of Flaw Orientation and Finite Aperture on Model Based Reconstruction Using Multiprobe Transducers

Section: Imaging and Reconstruction

Samuel J. Wormley, Iowa State University
David K. Hsu, Iowa State University
Donald O. Thompson, Iowa State University

Williamsburg, VA

12:00 AM

The Effects of Surface Roughness on Subsurface Defect Detection using Acoustic Microscopy

Section: Imaging and Reconstruction

P. Reinholdtsen, Stanford University
B. T. Khuri-Yakub, Stanford University

Williamsburg, VA

12:00 AM

The Influence of Calibration and Acceptance Criteria on Crack Detection and Discrimination by Eddy Current Techniques

Section: Reliability

Ward D. Rummel, Martin Marietta Corporation
Brent K. Christner, Martin Marietta Corporation
Steven J. Miller, Martin Marietta Corporation

Williamsburg, VA

12:00 AM

The Parametric Inverse Problem in Transient Scattering

Section: Inversion

D. G. Dudley, University of Arizona

Williamsburg, VA

12:00 AM

Theoretical and Experimental Investigation of Eddy Current Inspection of Pipes with Arbitrary Position of Sensor Coils

Section: Eddy Currents

S. G. Marinov, Dresser Industries, Inc.

Williamsburg, VA

12:00 AM

Thermal Wave Physics in NDE

Section: Imaging and Reconstruction

Allan Rosencwaig, Therma-Wave, Inc.

Williamsburg, VA

12:00 AM

Thermal Wave Scattering

Section: Other

Jon L. Opsal, Therma-Wave, Inc.

Williamsburg, VA

12:00 AM

Three Dimensional Inverse Scattering for the Classical Wave Equation with Variable Speed

Section: Inversion

Margaret Cheney, Duke University
James H. Rose, Iowa State University
Brian DeFacio, University of Missouri

Williamsburg, VA

12:00 AM

Time and Frequency Domain Measurements of Materials with High Ultrasonic Attenuation Using Time Delay Spectroscopy

Section: Signal Processing

Paul M. Gammell, National Aeronautics and Space Administration

Williamsburg, VA

12:00 AM

Ultrasonic Characterization of Lead Zirconate Titanate Ceramics

Section: Sensors

C. K. Jen, National Research Council of Canada
G. Shapiro, Almax Industries Ltd.
P. Cielo, National Research Council of Canada
J. F. Bussiere, National Research Council of Canada

Williamsburg, VA

12:00 AM

Ultrasonic Crack Characterization: A Constrained Inversion Algorithm

Section: Inversion

Lester W. Schmerr Jr., Iowa State University
Alexander Sedov, Lakehead University

Williamsburg, VA

12:00 AM

Ultrasonic Detection and Characterization of Microspherical Defects in Model Ceramics

Section: Ultrasonics

Arthur Stockman, McMaster University
Patrick Mathieu, McMaster University
Patrick S. Nicholson, McMaster University

Williamsburg, VA

12:00 AM

Ultrasonic Imaging and the Long Wavelength Phase

Section: Ultrasonics

James H. Rose, Iowa State University

Williamsburg, VA

12:00 AM

Ultrasonic Inspection of Partially Completed Welds Using Pattern Recognition Techniques

Section: Signal Processing

N. M. Carlson, EG&G Idaho, Inc.
J. A. Johnson, EG&G Idaho, Inc.

Williamsburg, VA

12:00 AM

Ultrasonic Sensors to Measure Internal Temperature Distribution

Section: Sensors

B. E. Droney, Bethlehem Steel Corporation
F. A. Mauer, National Bureau of Standards and Technology
S. J. Norton, National Bureau of Standards and Technology
Haydn N. G. Wadley, National Bureau of Standards and Technology

Williamsburg, VA

12:00 AM

Uniform Interrogating Field Eddy Current Technique and its Application

Section: Eddy Currents

Eugene Smith, United Technologies Corporation

Williamsburg, VA

12:00 AM

Use of Models to Predict Ultrasonic NDE Reliability

Section: Reliability

Timothy A. Gray, Iowa State University
R. Bruce Thompson, Iowa State University

Williamsburg, VA

12:00 AM

Weak Bond Screening System

Section: Systems

S. Y. Chuang, General Dynamics
F. H. Chang, General Dynamics
J. R. Bell, General Dynamics

Williamsburg, VA

12:00 AM

Wideband Non-Contacting Ultrasonic Transducer

Section: Sensors

M. W. Godfrey, Loughborough University of Technology
D. C. Emmony, Loughborough University of Technology

Williamsburg, VA

12:00 AM

XIM: X-Ray Inspection Module for Automatic High Speed Inspection of Turbine Blades and Automated Flaw Detection and Classification

Section: Systems

D. W. Oliver, General Electric
J. Brown, General Electric
K. Cueman, General Electric
J. Czechowski, General Electric
J. Eberhard, General Electric
J. Eng, General Electric
R. Joynson, General Electric
J. Keaveney, General Electric
R. Koegl, General Electric
R. Miller, General Electric
K. Silverstein, General Electric
L. Thumhart, General Electric
R. Trzaskos, General Electric
T. Kincaid, Boston University
H. Scudder, Boston University
C. R. Wojciechowski, General Electric
L. Howington, General Electric
D. Ingram, General Electric
R. Isaacs, General Electric
L. Meyer, General Electric
J. Portaz, General Electric
J. Schuler, General Electric
J. Sostarich, General Electric
D. Steele, General Electric

Williamsburg, VA

12:00 AM