Schedule

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1989
Sunday, January 1st
12:00 AM

A Photothermal Deflection Method for Monitoring Photoelectronic and Nonradiative Energy Conversion in Semiconductor Photoelectrochemical Cells

Section: Electronic Materials and Devices

Robert E. Wagner, University of Toronto
Andreas Mandelis, University of Toronto

La Jolla, CA

12:00 AM

Applications of Phase Microscopy to Photothermal Spectroscopy

Section: Electronic Materials and Devices

Marc A. Taubenblatt, IBM

La Jolla, CA

12:00 AM

Detecting Cracks in Semiconductor Solarcells from Eddy-Current Measurements

Section: Electronic Materials and Devices

Jeff C. Treece, Sabbagh Associates, Inc.
Bishara F. Shamee, Sabbagh Associates, Inc.

La Jolla, CA

12:00 AM

Detection of Composite Delaminations and Broken Solder Joints by a Full-Field Laser Doppler Technique

Section: Electronic Materials and Devices

David E. Oliver, Ometron, Inc.
Jeanne M. Vetter, Ometron, Inc.
Charles E. Bakis, Virginia Polytechnic Institute and State University

La Jolla, CA

12:00 AM

Digital Stereo Radiography, Applications to Imaging of Printed Circuit Boards

Section: Electronic Materials and Devices

Lewis J. Thomas III, General Electric Company
M. Kent Cueman, General Electric Company

La Jolla, CA

12:00 AM

In-Situ Characterization of Carrier Mobility in Field Effect Transistors

Section: Electronic Materials and Devices

Andreas G. Andreou, Johns Hopkins University

La Jolla, CA

12:00 AM

Modulated Interference Effects and Thermal Wave Monitoring of High-Dose Ion Implantation in Semiconductors

Section: Electronic Materials and Devices

Jon Opsal, Therma-Wave, Inc.

La Jolla, CA

12:00 AM

Nondestructive Mapping of Surface Film Parameters with Dynamic Imaging Microellipsometry

Section: Electronic Materials and Devices

Ralph F. Cohn, Johns Hopkins University
James W. Wagner, Johns Hopkins University

La Jolla, CA

12:00 AM

Photopyroelectric Spectroscopy (P2ES) of a-Si:H Thin Semiconducting Films on Quartz

Section: Electronic Materials and Devices

A. Mandelis, University of Toronto
R. E. Wagner, University of Toronto
K. Ghandi, University of Toronto
R. Baltman, University of Toronto
Phat Dao, Eastman Kodak

La Jolla, CA

12:00 AM

Point Matching Method for Flaw Detection in Printed Circuit Boards

Section: Electronic Materials and Devices

M. J. Donahue, Ohio State University
A. P. Sprague, Ohio State University
S. I. Rokhlin, Ohio State University

La Jolla, CA

12:00 AM

Subsurface Defects in Silicon Investigated by Modulated Optical Reflectance Measurements

Section: Electronic Materials and Devices

Jeff Bailey, University of California, Berkeley
Eicke Weber, University of California, Berkeley
Jon Opsal, Therma-Wave, Inc.

La Jolla, CA

12:00 AM

Thermal Wave Characterization of Semiconductors and Superconductors

Section: Electronic Materials and Devices

Allan Rosencwaig, Therma-Wave, Inc.
John Opsal, Therma-Wave, Inc.
W. L. Smith, Therma-Wave, Inc.
D. L. Willenborg, Therma-Wave, Inc.

La Jolla, CA

12:00 AM