Location

La Jolla, CA

Start Date

1-1-1989 12:00 AM

Description

The need for in-process characterization of metallic components is being recognized increasingly. In the field of x-ray analysis the x-ray fluorescent (spectroscopy) techniques have been successfully applied to in-process inspection, while successes in x-ray diffraction have been sparse. X-ray diffraction characterization techniques should be fast, non-contacting, and tolerant of detector to component distance variation. The Ruud-Barrett position-sensitive scintillation detector (R-B PSSD) is unique in its ability to satisfy these requirements, and has been successful in measuring plastic deformation, residual stress and crystalline texture in FCC metal alloys.

Volume

8B

Chapter

Chapter 9: Characterization of Materials

Section

Deformation and Fracture

Pages

1795-1801

DOI

10.1007/978-1-4613-0817-1_227

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Plastic Deformation, Residual Stress, and Crystalline Texture Measurements for In-Process Characterization of FCC Metal Alloys

La Jolla, CA

The need for in-process characterization of metallic components is being recognized increasingly. In the field of x-ray analysis the x-ray fluorescent (spectroscopy) techniques have been successfully applied to in-process inspection, while successes in x-ray diffraction have been sparse. X-ray diffraction characterization techniques should be fast, non-contacting, and tolerant of detector to component distance variation. The Ruud-Barrett position-sensitive scintillation detector (R-B PSSD) is unique in its ability to satisfy these requirements, and has been successful in measuring plastic deformation, residual stress and crystalline texture in FCC metal alloys.