High Resolution X-Ray Computed Tomography for Composites and Electronics Inspection
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Begun in 1973, the Review of Progress in Quantitative Nondestructive Evaluation (QNDE) is the premier international NDE meeting designed to provide an interface between research and early engineering through the presentation of current ideas and results focused on facilitating a rapid transfer to engineering development.
This site provides free, public access to papers presented at the annual QNDE conference between 1983 and 1999, and abstracts for papers presented at the conference since 2001.
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Abstract
A useful computed tomography (CT) or digital radiography (DR) system must simultaneously resolve both the smallest meaningful features and least relevant differences in density in the objects it is designed to inspect. The advent of structural composites and high-density electronic assemblies requires digital x-ray systems that are tailored to their properties. The critical flaw size in graphite composites is thought to be 25 to 50 μm. Similarly, prototype military electronics are now being assembled on circuit boards with conductive patterns only 100 μm in width.