Location

La Jolla ,CA

Start Date

1-1-1989 12:00 AM

Description

A method in current use for defect detection in thick walled components is the tandem technique [1]. With the aim to replace this cumbersome two-probe technique, a high sensitivity one-probe technique for the detection of perpendicularly oriented cracks and lack of fusion defects has been developed [2–4]. The high sensitivity of this so-called LLT-technique results from the effective mode conversion at the defect from a longitudinal wave to a shear wave and the exploitation of the specular reflections. In comparison to the tandem technique the LLT-technique shows an improved defect localization, improved accessibility of the inspection regions, minor obliquity dependence and minor cladding effects in the inspection of cladded components from the outside. Further, mode conversion effects can be used for a defect classification.

Book Title

Review of Progress in Quantitative Nondestructive Evaluation

Volume

8A

Chapter

Chapter 2: Advanced Techniques

Section

Other New Techniques

Pages

591-598

DOI

10.1007/978-1-4613-0817-1_74

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Crack Detection and Defect Classification Using the LLT-Technique

La Jolla ,CA

A method in current use for defect detection in thick walled components is the tandem technique [1]. With the aim to replace this cumbersome two-probe technique, a high sensitivity one-probe technique for the detection of perpendicularly oriented cracks and lack of fusion defects has been developed [2–4]. The high sensitivity of this so-called LLT-technique results from the effective mode conversion at the defect from a longitudinal wave to a shear wave and the exploitation of the specular reflections. In comparison to the tandem technique the LLT-technique shows an improved defect localization, improved accessibility of the inspection regions, minor obliquity dependence and minor cladding effects in the inspection of cladded components from the outside. Further, mode conversion effects can be used for a defect classification.