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1990
Monday, January 1st
12:00 AM

Anomalous Thermal Diffusivity of Amorphous Semiconductor Superlattices

S. Y. Zhang, Nanjing University
A. C. Boccara, ESPCI
D. Fournier, ESPCI
J. P. Roger, ESPCI
Z. C. Wang, Nanjing University

Brunswick, ME

12:00 AM

Detection of Cracks in Si3N4 Base Ceramics Using Microfocus Radiography

Kamal E. Amin, Norton Company

Brunswick, ME

12:00 AM

Dissipation Measurement in High TcSuperconductors with Electromagnetic Probes

K. L. Telschow, EG&G
T. K. O'Brien, Idaho State University

Brunswick, ME

12:00 AM

Electronics Applications of Resonance Imaging

T. O. Poehler, Johns Hopkins University
W. A. Bryden, Johns Hopkins University

Brunswick, ME

12:00 AM

Nonuniform Transition Conductivity of Superconducting Ceramic

Edward R. Generazio, Lewis Research Center, National Aeronautics and Space Administration
Don J. Roth, Lewis Research Center, National Aeronautics and Space Administration
Aloysius F. Hepp, Lewis Research Center, National Aeronautics and Space Administration

Brunswick, ME

12:00 AM

Parallel Imaging of Thickness Variations and Disbonding of Thermal Barrier Coatings by Time-Resolved Infrared Radiometry (TRIR)

J. W. Maclachlan Spicer, Johns Hopkins University
W. D. Kerns, Johns Hopkins University
L. C. Aamodt, Johns Hopkins University
J. C. Murphy, Johns Hopkins University

Brunswick, ME

12:00 AM

Photoacoustic Evaluation of Green State Alumina Samples

Markku Oksanen, University of Helsinki
Mauri Luukkala, University of Helsinki

Brunswick, ME

12:00 AM

Photothermal Length Measurement of Vickers Cracks in SI3N4

Jukka Rantala, University of Helsinki
Jari Hartikainen, University of Helsinki
Reijo Lehtiniemi, University of Helsinki
Reijo Vuohelainen, University of Helsinki
Mauri Luukkala, University of Helsinki
Jussi Jaarinen, Neste OY

Brunswick, ME

12:00 AM

Scanning Tunneling Microscopy for Morphological Characterization of InN Thin Films

R. Fainchtein, Johns Hopkins University
D. Dayan, Nuclear Research Center Negev
W A. Bryden, Johns Hopkins University
J C. Murphy, Johns Hopkins University
T O. Poehler, Johns Hopkins University

Brunswick, ME

12:00 AM

Scanning-Tunneling-Spectroscopy Determination of Barrier Potentials in Air or Moderate Vacuum

G. C. Wetsel Jr., Southern Methodist University
Z. M. Liu, Southern Methodist University
S. E. McBride, Southern Methodist University
T. L. Weng, Southern Methodist University
W. M. Gosney, Johns Hopkins University
R. J. Warmach, Oak Ridge National Laboratory

Brunswick, ME

12:00 AM

Temperature Measurement of Silicon Wafers Using Photoacoustic Techniques

Y. J. Lee, Stanford University
C. H. Chou, Stanford University
B. T. Khuri-Yakub, Stanford University
K. Saraswat, Stanford University
M. Moslehi, Texas Instruments

Brunswick, ME

12:00 AM

Thermal Wave and Raman Characterization of Diamond Films

R. W. Pryor, Wayne State University
P. K. Kuo, Wayne State University
Lanhua Wei, Wayne State University
R. L. Thomas, Wayne State University

Brunswick, ME

12:00 AM

Thermal Wave Imaging of Nonvisible Defects in IC Devices

W. Lee Smith, Therma-Wave, Inc.
C. G. Welles, Therma-Wave, Inc.
Allan Rosencwaig, Therma-Wave, Inc.

Brunswick, ME

12:00 AM

Ultrasonic Characterization of Surface and Sub-Surface Defects in Ceramic Materials

A. Stockman, McMaster University
M. Lam, McMaster University
P. S. Nicholson, McMaster University

Brunswick, ME

12:00 AM