Location

Brunswick, ME

Start Date

1-1-1990 12:00 AM

Description

Using reflection coefficients to obtain bond strengths and other bondline characteristics has been proposed by previous researchers(1,2). For configurations where the bondline of interest is well separated from the specimen surface and adjacent boundaries, measuring the reflection coefficient using broadband, pulse-echo, ultrasound can be done by processing the bondline echo taken directly from the A-scan. For configurations where the bondline is close to a parallel surface however, reverberations in the layer between the bondline and surface will cause successive bondline echoes to overlap in the A-scan, so that individual echoes can not be processed to determine the reflection coefficient directly. This paper presents a technique for processing the A-scan to obtain the desired reflection coefficient for the case when the bondline is near a surface.

Book Title

Review of Progress in Quantitative Nondestructive Evaluation

Volume

9B

Chapter

Chapter 7: Engineered Materials

Section

Adhesive Joints

Pages

1239-1246

DOI

10.1007/978-1-4684-5772-8_159

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Pulse Echo Technique to Determine Bondline Reflection Coefficients

Brunswick, ME

Using reflection coefficients to obtain bond strengths and other bondline characteristics has been proposed by previous researchers(1,2). For configurations where the bondline of interest is well separated from the specimen surface and adjacent boundaries, measuring the reflection coefficient using broadband, pulse-echo, ultrasound can be done by processing the bondline echo taken directly from the A-scan. For configurations where the bondline is close to a parallel surface however, reverberations in the layer between the bondline and surface will cause successive bondline echoes to overlap in the A-scan, so that individual echoes can not be processed to determine the reflection coefficient directly. This paper presents a technique for processing the A-scan to obtain the desired reflection coefficient for the case when the bondline is near a surface.