Location

Brunswick, ME

Start Date

1-1-1990 12:00 AM

Description

Scanning acoustic microscopy (SAM) employs mechanical scanning in both x and y directions. There is one great advantage in this configuration which is that imaging is done on axis, resulting in diffraction limited resolution. However a mechanical system is inherently slow and cumbersome, even though recent advances have brought the scanning time for an image at high frequencies down to the order of a second. For the inspection of inexpensive items such as integrated circuit chips, which is done at frequencies below 100 MHz, it is imperative to have a cheap and ideally real time system. The present work describes recent developments in our laboratory in this direction

Book Title

Review of Progress in Quantitative Nondestructive Evaluation

Volume

9A

Chapter

Chapter 2: Advanced Techniques

Section

C: Other New Techniques

Pages

545-551

DOI

10.1007/978-1-4684-5772-8_68

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Electronic Scanning in Acoustic Microscopy

Brunswick, ME

Scanning acoustic microscopy (SAM) employs mechanical scanning in both x and y directions. There is one great advantage in this configuration which is that imaging is done on axis, resulting in diffraction limited resolution. However a mechanical system is inherently slow and cumbersome, even though recent advances have brought the scanning time for an image at high frequencies down to the order of a second. For the inspection of inexpensive items such as integrated circuit chips, which is done at frequencies below 100 MHz, it is imperative to have a cheap and ideally real time system. The present work describes recent developments in our laboratory in this direction