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1991
Tuesday, January 1st
12:00 AM

Determination of Degree of Thermal Barrier Coating Disbonding by Time-Resolved Infrared Radiometry (TRIR)

J. W. Maclachlan Spicer, Johns Hopkins University
W. D. Kerns, Johns Hopkins University
L. C. Aamodt, Johns Hopkins University
J. C. Murphy, Johns Hopkins University

La Jolla, CA

12:00 AM

High-Resolution Thermal Wave Imaging of Surface and Subsurface Defects in IC Metal Lines

C. G. Welles, Therma-Wave, Inc.
A. Bivas, Therma-Wave, Inc.
W. Lee Smith, Therma-Wave, Inc.
Allan Rosencwaig, Therma-Wave, Inc.

La Jolla, CA

12:00 AM

Holographic Inspection of Wafers for Sub-Micron Defect Detection

Ken Radigan, National Semiconductor Corporation
Mike Slama, Sematech

La Jolla, CA

12:00 AM

IC Chip Package Inspection with an Amplitude and Phase Scanning Acoustic Microscope

C.-H. Chou, Stanford University
B. T. Khuri-Yakub, Stanford University

La Jolla, CA

12:00 AM

Infrared Thermal Wave Studies of Coated Surfaces

L. D. Favro, Wayne State University
H. J. Jin, Wayne State University
T. Ahmed, Wayne State University
X. Wang, Wayne State University
P. K. Kuo, Wayne State University
R. L. Thomas, Wayne State University

La Jolla, CA

12:00 AM

Low-Temperature Photothermal Measurements of High-TCSuperconductors

J. T. Fanton, Stanford University
A. Kapitulnik, Stanford University
B. T. Khuri-Yakub, Stanford University
G. S. Kino, Stanford University

La Jolla, CA

12:00 AM

Quantitative MRI Measurement of Binder Distributions in Green-State Ceramics

N. Gopalsami, Allied Signal Aerospace Company
S. L. Dieckman, Argonne National Laboratory
W. A. Ellingson, Argonne National Laboratory
R. E. Botto, Argonne National Laboratory
H. Yeh, Argonne National Laboratory

La Jolla, CA

12:00 AM

Surface Acoustic Wave Probing of Ceramic Bearing Balls

C. P. Hsieh, Stanford University
C.-H. Chou, Stanford University
B. T. Khuri-Yakub, Stanford University

La Jolla, CA

12:00 AM

The EDDY Current Sensing of Gallium Arsenide Crystal Growth: Calculated Response

H. N. G. Wadley, General Electric
K. P. Dharmasena, University of Virginia
H. S. Goldberg, University of Virginia

La Jolla, CA

12:00 AM

Time Resolved Optical Detection of Electron Loss and Migration in CdS

G. Chang, Johns Hopkins University
R. B. Givens, Johns Hopkins University
J. W. M. Spicer, Johns Hopkins University
J. C. Murphy, Johns Hopkins University

La Jolla, CA

12:00 AM

Ultrasonic Evaluation of Low Density Powder Compacts

Graham H. Thomas, Sandia National Laboratories
Susan L. Crawford, Sandia National Laboratories

La Jolla, CA

12:00 AM

X-Ray Tomographic Techniques for Inspection of Electronic Components

R. J. Kruse, Boeing
R. H. Bossi, Boeing

La Jolla, CA

12:00 AM