Location

Brunswick, ME

Start Date

1-1-1992 12:00 AM

Description

The technique of photothermal deflection spectroscopy (PTDS) for absorption measurement of optical thin film is simple in installation and fast in detection. However, while measurable absorbance reaches the order of magnitude of 10-7, e.g. in studies of optical thin film and investigation of laser damage mechanisms [1,2], we are still doubtful of its precision because of the lack of independent evaluation with available instruments whose precision could reach this lower limit. This work aims at giving a theoretical investigation on the source of error in order to obtain a realistic estimate of measurement error and hence to find optimal way to minimize measurement error in applying PTDS to optical thin film.

Book Title

Review of Progress in Quantitative Nondestructive Evaluation

Volume

11A

Chapter

Chapter 1: Fundamentals of Standard Techniques

Section

Thermal Techniques

Pages

501-506

DOI

10.1007/978-1-4615-3344-3_64

Language

en

File Format

application/pdf

Share

COinS
 
Jan 1st, 12:00 AM

Error Arising from Original Approximation in Photothermal Measurement of Weak Absorption of Optical Thin Film

Brunswick, ME

The technique of photothermal deflection spectroscopy (PTDS) for absorption measurement of optical thin film is simple in installation and fast in detection. However, while measurable absorbance reaches the order of magnitude of 10-7, e.g. in studies of optical thin film and investigation of laser damage mechanisms [1,2], we are still doubtful of its precision because of the lack of independent evaluation with available instruments whose precision could reach this lower limit. This work aims at giving a theoretical investigation on the source of error in order to obtain a realistic estimate of measurement error and hence to find optimal way to minimize measurement error in applying PTDS to optical thin film.