Location
Brunswick, ME
Start Date
1-1-1992 12:00 AM
Description
The technique of photothermal deflection spectroscopy (PTDS) for absorption measurement of optical thin film is simple in installation and fast in detection. However, while measurable absorbance reaches the order of magnitude of 10-7, e.g. in studies of optical thin film and investigation of laser damage mechanisms [1,2], we are still doubtful of its precision because of the lack of independent evaluation with available instruments whose precision could reach this lower limit. This work aims at giving a theoretical investigation on the source of error in order to obtain a realistic estimate of measurement error and hence to find optimal way to minimize measurement error in applying PTDS to optical thin film.
Book Title
Review of Progress in Quantitative Nondestructive Evaluation
Volume
11A
Chapter
Chapter 1: Fundamentals of Standard Techniques
Section
Thermal Techniques
Pages
501-506
DOI
10.1007/978-1-4615-3344-3_64
Copyright Owner
Springer-Verlag US
Copyright Date
January 1992
Language
en
File Format
application/pdf
Error Arising from Original Approximation in Photothermal Measurement of Weak Absorption of Optical Thin Film
Brunswick, ME
The technique of photothermal deflection spectroscopy (PTDS) for absorption measurement of optical thin film is simple in installation and fast in detection. However, while measurable absorbance reaches the order of magnitude of 10-7, e.g. in studies of optical thin film and investigation of laser damage mechanisms [1,2], we are still doubtful of its precision because of the lack of independent evaluation with available instruments whose precision could reach this lower limit. This work aims at giving a theoretical investigation on the source of error in order to obtain a realistic estimate of measurement error and hence to find optimal way to minimize measurement error in applying PTDS to optical thin film.
