Location

La Jolla, CA

Start Date

1-1-1993 12:00 PM

Description

Coherent optical techniques such as holography, shearography, and ESPI have been available for inspection applications for years. However, they are still not well known or widely used. In fact, they have sometimes been described as “a solution looking for a problem” and like so many new technologies, they may have been somewhat oversold. These optical NDE methods do, however, offer some impressive advantages over more conventional inspection techniques for the right applications. It is the intent of this paper to provide some basic information on how two of these optical methods, holography and shearography, work discuss capabilities and limitations of both, present the electronic holography and shearography inspection system developed by UTRC/Pratt & Whitney, and provide some examples of successful applications of both.

Book Title

Review of Progress in Quantitative Nondestructive Evaluation

Volume

12A

Chapter

Chapter 1: Development of Standard Techniques

Section

Optical Techniques

Pages

381-386

DOI

10.1007/978-1-4615-2848-7_49

Language

en

File Format

application/pdf

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Jan 1st, 12:00 PM

Electronic holography and shearography NDE for inspection of modern materials and structures

La Jolla, CA

Coherent optical techniques such as holography, shearography, and ESPI have been available for inspection applications for years. However, they are still not well known or widely used. In fact, they have sometimes been described as “a solution looking for a problem” and like so many new technologies, they may have been somewhat oversold. These optical NDE methods do, however, offer some impressive advantages over more conventional inspection techniques for the right applications. It is the intent of this paper to provide some basic information on how two of these optical methods, holography and shearography, work discuss capabilities and limitations of both, present the electronic holography and shearography inspection system developed by UTRC/Pratt & Whitney, and provide some examples of successful applications of both.