Location

La Jolla, CA

Start Date

1-1-1993 12:00 PM

Description

Due to diffraction of US by crack tips, a misinterpretation of C-Scans can be made by mistaking detection of a large misoriented crack for a small flaw. As the latter is often tolerable, the former jeopardizes the life of the piece. Fig. 1. shows C-Scans at various amplification levels. The two spots due to diffraction by the near and far tips of a crack can be interpreted as arising from two small defects, even at high amplification level (+18 dB) for which S/N ratio becomes unacceptable.

Book Title

Review of Progress in Quantitative Nondestructive Evaluation

Volume

12A

Chapter

Chapter 1: Development of Standard Techniques

Section

Elastic Wave Scattering

Pages

75-82

DOI

10.1007/978-1-4615-2848-7_9

Language

en

File Format

application/pdf

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Jan 1st, 12:00 PM

A theoretical approach for the discrimination of crack tip and small defect echoes

La Jolla, CA

Due to diffraction of US by crack tips, a misinterpretation of C-Scans can be made by mistaking detection of a large misoriented crack for a small flaw. As the latter is often tolerable, the former jeopardizes the life of the piece. Fig. 1. shows C-Scans at various amplification levels. The two spots due to diffraction by the near and far tips of a crack can be interpreted as arising from two small defects, even at high amplification level (+18 dB) for which S/N ratio becomes unacceptable.