Location

Snowmass Village, CO

Start Date

1-1-1995 12:00 AM

Description

A Scanning Acoustic Microscope (SAM) is a device used to identify the difference of the local acoustic properties at surface or subsurface of solid materials using high frequency surface wave, usually above 100 MHz. The major function of the SAM is to visualize the internal microstructures of materials. The other is to measure the surface wave velocity with the V(Z) curve. If the surface wave velocity could be accurately measured using the V(Z) curve, it is possible to evaluate the surface stresses within very localized region with the acoustoelastic law.

Volume

14B

Chapter

Chapter 6: Material Properties

Section

Stress and Texture

Pages

1883-1889

DOI

10.1007/978-1-4615-1987-4_241

Language

en

File Format

application/pdf

Share

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Jan 1st, 12:00 AM

Measurement of Acoustoelastic Coefficient of Surface Waves with Scanning Acoustic Microscope

Snowmass Village, CO

A Scanning Acoustic Microscope (SAM) is a device used to identify the difference of the local acoustic properties at surface or subsurface of solid materials using high frequency surface wave, usually above 100 MHz. The major function of the SAM is to visualize the internal microstructures of materials. The other is to measure the surface wave velocity with the V(Z) curve. If the surface wave velocity could be accurately measured using the V(Z) curve, it is possible to evaluate the surface stresses within very localized region with the acoustoelastic law.