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1996
Monday, January 1st
12:00 AM

A New Technique for Distinguishing Internal Voids from Solid Inclusions

Section: Image Analysis

K. I. Maslov, Russian Academy of Science
T. Kundu, University of Arizona
O. I. Lobkis, Russian Academy of Science

Seattle, WA

12:00 AM

A Novel Image Processing Algorithm for Enhancing the Probability of Detection of Flaws in X-Ray Images

Section: Image Analysis

Nawapak Eua-Anant, Iowa State University
Ibrahim Elshafiey, Iowa State University
Lalita Udpa, Iowa State University
Joseph N. Gray, Iowa State University

Seattle, WA

12:00 AM

An Application of Wavelet Signal Processing to Ultrasonic Nondestructive Evaluation

Section: Signal Processing

Alan Van Nevel, University of Missouri–Columbia
Brian DeFacio, University of Missouri–Columbia
Steven P. Neal, University of Missouri–Columbia

Seattle, WA

12:00 AM

Computed Tomography Using Laser-Based Ultrasonics

Section: Image Analysis

Y. Nagata, Northwestern University
J. Huang, Northwestern University
Jan D. Achenbach, Northwestern University
S. Krishnaswamy, Northwestern University

Seattle, WA

12:00 AM

Conductivity Imaging in Plates Using Current Injection Tomography

Section: Image Analysis

Daniel J. Staton, Vanderbilt University
Sergei V. Rousakov, Vanderbilt University
John P. Wikswo Jr., Vanderbilt University

Seattle, WA

12:00 AM

Crack Parameter Characterization by a Neural Network

Section: Signal Processing

M. Takadoya, Mitsubishi Research Institute
J. D. Achenbach, Northwestern University
G. C. Guo, Northwestern University
M. Kitahara, Tokai University

Seattle, WA

12:00 AM

Development of a New Method for the Inspection of a 3D Volume of Ultrasonic Data

Section: Image Analysis

J. Moysan, Instituts universitaires de technologie
G. Corneloup, Instituts universitaires de technologie
F. Guerault, Instituts universitaires de technologie
O. Roy, CEN Saclay

Seattle, WA

12:00 AM

Echo Extraction from an Ultrasonic Signal Using Continuous Wavelet Transform

Section: Signal Processing

O. Roy, CE Saclay
J Sallard, CE Saclay
S. E. Moubarik, Ecole centrale de Paris

Seattle, WA

12:00 AM

Eddy Current Image Restoration Using the Groshong Parametric Model

Section: Image Analysis

T. Sollier, Commissariat à l’Energie Atomique
J.-M. Philippe, Commissariat à l’Energie Atomique
H. Maury, Commissariat à l’Energie Atomique
D. Villard, Électricité de France

Seattle, WA

12:00 AM

Edge Detection on Eddy Current Image to Increase Defect Characterization

Section: Image Analysis

B. Benoist, Commissariat à l’Energie Atomique
P. Attaoui, Commissariat à l’Energie Atomique
R. La, Commissariat à l’Energie Atomique
R. Lengellé, Université de Technologie de Compiègne
P. Gaillard, Université de Technologie de Compiègne
J. Reuchet, Commissariat à l’Energie Atomique

Seattle, WA

12:00 AM

Fuzzy Inference Systems for Invariant Pattern Recognition in MFL NDE

Section: Signal Processing

S. Mandayam, Iowa State University
L. Udpa, Iowa State University
S. S. Udpa, Iowa State University
W. Lord, Iowa State University

Seattle, WA

12:00 AM

High Resolution Image Reconstruction of Polymer Composite Materials Using Neural Networks

Section: Image Analysis

A. C. Pardoe, University of Warwick
D. A. Hutchins, University of Warwick
J. T. Mottram, University of Warwick
E. L. Hines, University of Warwick

Seattle, WA

12:00 AM

Imaging Flaws under Insulation Using a Squid Magnetometer

Section: Image Analysis

A. C. Bruno, University of Rio de Janeiro
C. Hall Barbosa, University of Rio de Janeiro
J. E. Zimmerman, University of Rio de Janeiro
P. Costa Ribeiro, University of Rio de Janeiro
E. Andrade Lima, University of Rio de Janeiro
L. F. Scavarda, University of Rio de Janeiro
C. Kelber, University of Rio de Janeiro
J. Szczupak, University of Rio de Janeiro
C. S. Camerini, Petrobrás

Seattle, WA

12:00 AM

Imaging of Creep Damaged CrMo Steel Piping Using Magnetic Parameter Variations

Section: Image Analysis

M. A. Negley, Iowa State University
David C. Jiles, Iowa State University

Seattle, WA

12:00 AM

Improvement of Time Reversal Processing in Titanium Inspections

Section: Signal Processing

Véronique Miette, University of Paris VII
Mathias Fink, University of Paris VII
François Wu, University of Paris VII

Seattle, WA

12:00 AM

Improvement to Defect Detection by Ultrasonic Data Processing: The DTVG Method

Section: Image Analysis

G. Corneloup, Instituts universitaires de technologie
J. Moysan, Instituts universitaires de technologie
D. Francois, Électricité de France

Seattle, WA

12:00 AM

Introduction of the Signature Classification Development System

Section: Signal Processing

Lawrence M. Brown, United States Navy
Jeffrey S. Lin, Johns Hopkins University

Seattle, WA

12:00 AM

Magneto-Optic Image Classification Using Neural Networks

Section: Image Analysis

S. Nath, Johns Hopkins University
J. P. Fulton, National Aeronautics and Space Administration
B. Wincheski, National Aeronautics and Space Administration

Seattle, WA

12:00 AM

Optimum Filter Based Techniques for Data Fusion

Section: Signal Processing

J. Yim, Iowa State University
S. S. Udpa, Iowa State University
Mani Mina, Iowa State University
L. Udpa, Iowa State University

Seattle, WA

12:00 AM

Quantitative Evaluation of Defects by Fuzzy Reasoning Based on Principal Component Analysis

Section: Signal Processing

T. Ogi, Mitsubishi Research Institute
T. Mandai, Mitsubishi Research Institute
Y. Yabe, Mitsubishi Research Institute
M. Kitahara, Tokai University
J. D. Achenbach, Northwestern University

Seattle, WA

12:00 AM

Registration Issues in the Fusion of Eddy Current and Ultrasound NDE Data Using Q-Transforms

Section: Signal Processing

Kai Sun, Iowa State University
Satish Udpa, Iowa State University
Lalita Udpa, Iowa State University
Tianji Xue, Iowa State University
William Lord, Iowa State University

Seattle, WA

12:00 AM

Singular Value Decomposition of Wigner Distribution for Time-Frequency Representation of Ultrasonic Echoes

Section: Signal Processing

X. M. Jin, Illinois Institute of Technology
M. A. Malik, Illinois Institute of Technology
J. Saniie, Illinois Institute of Technology

Seattle, WA

12:00 AM

Testing for Nongaussian Fluctuations in Grain Noise

Section: Signal Processing

Steven P. Neal, University of Missouri–Columbia
Kevin D. Donohoe, University of Kentucky

Seattle, WA

12:00 AM

Ultrasonic Imaging of Anomalies in Truck Tires

Section: Image Analysis

A. Cheng, Northwestern University
Jan D. Achenbach, Northwestern University
R. Rogers, BANDAG Incorporated
M. Peterson, Colorado State University

Seattle, WA

12:00 AM

Virtual Reality for Nondestructive Evaluation Applications

Section: Image Analysis

Jaejoon Kim, Iowa State University
S. Mandayam, Iowa State University
Satish S. Udpa, Iowa State University
William Lord, Iowa State University
L. Udpa, Iowa State University

Seattle, WA

12:00 AM

Wavelet Transform Signal Processing Applied to Ultrasonics

Section: Signal Processing

A. Abbate, United States Army
J. Frankel, United States Army
P. Das, Rensselaer Polytechnic Institute

Seattle, WA

12:00 AM