Location

Seattle, WA

Start Date

1-1-1996 12:00 AM

Description

For many years, the inspection of components using eddy current (EC) techniques has been playing an important role in the nondestructive evaluation (NDE) industry. There are many factors which affect the probability of detection (POD) of flaws. One important consideration is how to select suitable EC probes to inspect a given test component with certain class of flaws. Commonly, the performance of an EC probe design for a scan is evaluated experimentally by physically constructing prototype probes and perform test scans. This approach is both time-consuming and expensive. In particular, the EC probe has to be reconstructed each time the probe design is changed and the design cycle typically requires a number of iterations before a satisfactory performance is achieved.

Volume

15A

Chapter

Chapter 4: NDE Sensors

Section

Electromagnetic Probes (EC, Remote Field, MOI, SQUID)

Pages

1105-1111

DOI

10.1007/978-1-4613-0383-1_144

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Computer Assisted Eddy Current Probe Design

Seattle, WA

For many years, the inspection of components using eddy current (EC) techniques has been playing an important role in the nondestructive evaluation (NDE) industry. There are many factors which affect the probability of detection (POD) of flaws. One important consideration is how to select suitable EC probes to inspect a given test component with certain class of flaws. Commonly, the performance of an EC probe design for a scan is evaluated experimentally by physically constructing prototype probes and perform test scans. This approach is both time-consuming and expensive. In particular, the EC probe has to be reconstructed each time the probe design is changed and the design cycle typically requires a number of iterations before a satisfactory performance is achieved.