Location

Seattle, WA

Start Date

1-1-1996 12:00 AM

Description

Line focus acoustic microscopy (LFAM) provides a method to determine the elastic constants of homogeneous materials and thin-film/substrate configurations, see Refs. [1–5]. The elastic constants are determined from the velocities of surface acoustic waves, which are obtained from measurement of the V(z) curve. Generally more than one elastic constant has to be determined. It is interesting to note that the procurement of sufficient data is sometimes more complicated for isotropic materials. For anisotropic solids the velocity can be measured as a function of the angle defining the propagation direction in the surface to yield a sufficiently large data set. For thin-film/substrate configurations measurements at various frequencies or for different film thickness may be carried out to obtain sufficient data. There are, however, obvious advantages to work with a single specimen and at a single frequency. This can be done by considering the contributions of more than one leaky SAW mode to the V(z) curve.

Book Title

Review of Progress in Quantitative Nondestructive Evaluation

Volume

15B

Chapter

Chapter 6: Material Properties

Section

Linear Elastic and Nonlinear Properties

Pages

1415-1422

DOI

10.1007/978-1-4613-0383-1_185

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Determination of Elastic Constants by Line-Focus V(Z) Measurements of Multiple Saw Modes

Seattle, WA

Line focus acoustic microscopy (LFAM) provides a method to determine the elastic constants of homogeneous materials and thin-film/substrate configurations, see Refs. [1–5]. The elastic constants are determined from the velocities of surface acoustic waves, which are obtained from measurement of the V(z) curve. Generally more than one elastic constant has to be determined. It is interesting to note that the procurement of sufficient data is sometimes more complicated for isotropic materials. For anisotropic solids the velocity can be measured as a function of the angle defining the propagation direction in the surface to yield a sufficiently large data set. For thin-film/substrate configurations measurements at various frequencies or for different film thickness may be carried out to obtain sufficient data. There are, however, obvious advantages to work with a single specimen and at a single frequency. This can be done by considering the contributions of more than one leaky SAW mode to the V(z) curve.