Location

Seattle, WA

Start Date

1-1-1996 12:00 AM

Description

This paper describes a system for measuring the thicknesses of a multi-layered film. Standard techniques measuring the thicknesses of plastic coatings on a metal substrate do exist [1]. However, such techniques are incapable of offering the micron level resolution required for the application at hand. This project concerns measuring the individual layer thicknesses in a three layer film. The objective of the research is to estimate the thickness of each layer. This paper describes a system designed for measuring the thicknesses of the film layers.

Book Title

Review of Progress in Quantitative Nondestructive Evaluation

Volume

15B

Chapter

Chapter 6: Material Properties

Section

Coatings

Pages

1581-1587

DOI

10.1007/978-1-4613-0383-1_207

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Eddy Current Measurement of Thicknesses in Multiple-Layered Film

Seattle, WA

This paper describes a system for measuring the thicknesses of a multi-layered film. Standard techniques measuring the thicknesses of plastic coatings on a metal substrate do exist [1]. However, such techniques are incapable of offering the micron level resolution required for the application at hand. This project concerns measuring the individual layer thicknesses in a three layer film. The objective of the research is to estimate the thickness of each layer. This paper describes a system designed for measuring the thicknesses of the film layers.