Eddy Current Measurement of Thicknesses in Multiple-Layered Film
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Begun in 1973, the Review of Progress in Quantitative Nondestructive Evaluation (QNDE) is the premier international NDE meeting designed to provide an interface between research and early engineering through the presentation of current ideas and results focused on facilitating a rapid transfer to engineering development.
This site provides free, public access to papers presented at the annual QNDE conference between 1983 and 1999, and abstracts for papers presented at the conference since 2001.
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Abstract
This paper describes a system for measuring the thicknesses of a multi-layered film. Standard techniques measuring the thicknesses of plastic coatings on a metal substrate do exist [1]. However, such techniques are incapable of offering the micron level resolution required for the application at hand. This project concerns measuring the individual layer thicknesses in a three layer film. The objective of the research is to estimate the thickness of each layer. This paper describes a system designed for measuring the thicknesses of the film layers.