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1997
Wednesday, January 1st
12:00 AM

A Multiresolution Approach for Characterizing MFL Signatures from Gas Pipeline Inspections

Section: Signal Processing

K. Hwang, Iowa State University
S. Mandayam, Iowa State University
S. S. Udpa, Iowa State University
L. Udpa, Iowa State University
W. Lord, Iowa State University

Brunswick, ME

12:00 AM

A New Approach for Practical Two Dimensional Data Fusion Utilizing a Single Eddy Current Probe

Section: Signal Processing

M. Minachi, Iowa State University
S. S. Udpa, Iowa State University
L. Udpa, Iowa State University
J. Yim, Hyundai Electronics Industries Co., Ltd.

Brunswick, ME

12:00 AM

A New Morphological Approach for Removing Speckle Noise and Emphasizing Defect Features in Ultrasonic Images

Section: Signal Processing

Young-Won Song, Iowa State University
Satish S. Udpa, Iowa State University

Brunswick, ME

12:00 AM

Automatic Procedure for Thermal NDE of Delaminations in CFRP by Using Neural Networks

Section: Signal Processing

S. Marinetti, Istituto per la Tecnica del Freddo
P. G. Bison, Istituto per la Tecnica del Freddo
E. Grinzato, Istituto per la Tecnica del Freddo
G. Manduchi, Consiglio Nazionale delle Ricerche

Brunswick, ME

12:00 AM

Automation of Electric Current Injection NDE by Neural Networks

Section: Signal Processing

C. Hall Barbosa, Pontifical Catholic University of Rio de Janeiro
A. C. Bruno, Pontifical Catholic University of Rio de Janeiro
M. Vellasco, Pontifical Catholic University of Rio de Janeiro
M. Pacheco, Pontifical Catholic University of Rio de Janeiro
C. S. Camerini, SEMEC

Brunswick, ME

12:00 AM

Classification of Ultrasonic Weld Inspection Data Using Principal Component Analysis

Section: Signal Processing

Sangmin Bae, Iowa State University
Lalita Udpa, Iowa State University
Satish Udpa, Iowa State University
Tom Taylor, Electric Power Research Institute

Brunswick, ME

12:00 AM

Clearer ECT Flaw Image Utilizing CT Inversion Technique

Section: Image Analysis

Hiroshi Hoshikawa, Nihon University
Kiyoshi Koyama, Nihon University

Brunswick, ME

12:00 AM

Enhancement of B- and C-Scan Images of C-Sam with an Acoustic Matching Layer

Section: Image Analysis

Koichiro Kawashima, Nagoya Institute of Technology
Shigenori Ohta, Nagoya Institute of Technology
Tadahiro Mizutani, Nagoya Institute of Technology
Naoya Nishimura, Nagoya Institute of Technology
Isao Ishikawa, Hitachi Construction Machinery

Brunswick, ME

12:00 AM

Image Processing Techniques to Remove Depth Bias Effects in Magnetic Source Images of Deep Cracks

Section: Image Analysis

E. Andrade Lima, Pontifical Catholic University of Rio de Janeiro
A. C. Bruno, Pontifical Catholic University of Rio de Janeiro
J. Szczupak, Pontifical Catholic University of Rio de Janeiro

Brunswick, ME

12:00 AM

Model-Based Signal Processing for Laser Ultrasonic Signal Enhancement

Section: Signal Processing

R. D. Huber, Lawrence Livermore National Laboratory
D. J. Chinn, Lawrence Livermore National Laboratory
G. H. Thomas, Lawrence Livermore National Laboratory
J. V. Candy, Lawrence Livermore National Laboratory
J. B. Spicer, Johns Hopkins University

Brunswick, ME

12:00 AM

Neural Network Inversion for Thickness Measurements and Conductivity Profiling

Section: Signal Processing

G. Katragadda, Karta Technology, Inc.
J. Wallace, Karta Technology Inc.
J. Lee, Karta Technology, Inc.
S. Nair, Karta Technology, Inc.

Brunswick, ME

12:00 AM

Neuro-Fuzzy Systems in Ultrasonic Weld Evaluation

Section: Signal Processing

G. Katragadda, Karta Technology, Inc.
S. Nair, Karta Technology Inc.
G. P. Singh, Karta Technology, Inc.

Brunswick, ME

12:00 AM

Object Pose Estimation Using a Set of Local Radiographs of a Part and Its CAD Model

Section: Image Analysis

A. Koenig, Technologies Avancées
A. Glière, Technologies Avancées
P. Rizo, Technologies Avancées
B. Bell, Sowerby Research Centre
B. Paul, Sowerby Research Centre
J. Anderson, Sowerby Research Centre

Brunswick, ME

12:00 AM

Theoretical, Simulated, and Experimental Resolution Enhancement of a Transducer by Deconvolution of the Point Spread Function

Section: Signal Processing

J. Downs III, Colorado State University
M. L. Peterson, Colorado State University

Brunswick, ME

12:00 AM

Weld Inspection by Radioscopy: Computer Simulation and Automatic Segmentation

Section: Image Analysis

C. Gueudré, CEA-Centre d’Etudes de Valduc
J. Moysan, Institut Universitaire de Technologie
G. Corneloup, Institut Universitaire de Technologie

Brunswick, ME

12:00 AM