Schedule

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1998
Thursday, January 1st
12:00 AM

A Formalism for Predicting Ultrasonic Properties of Alloys in a Semi-Solid State

Section: Process Modeling/Control

A. F. Niessner III, Raytheon TI Systems
G. A. Gordon, Pennsylvania State University

La Jolla, CA

12:00 AM

A Novel High Speed, High Resolution, Ultrasound Imaging System

Section: New Techniques

Marvin Lasser, Imperium, Inc.

La Jolla, CA

12:00 AM

A Study on Characteristics of Echoes from Planar Defects by the Ultrasonic Testing of Angle Beam Technique

Section: Process Modeling/Control

Hiromi Shirahata, Musashi Institute of Technology
Chitoshi Miki, Tokyo Institute of Technology

La Jolla, CA

12:00 AM

A Study on the Measurement of in-Plane Displacement at High Temperature by Electronic Speckle Pattern Interferometry Method

Section: New Techniques

Koung-Suk Kim, Chosun University
Hyoung-Tek Kim, Chosun University
Yong-Hoon Cha, Chosun University
Hyun-Chul Jung, Chosun University
Soon-Suk Jarng, Chosun University
Jae-Yeol Kim, Chosun University
Seong-Pil Yang, Dong-A College

La Jolla, CA

12:00 AM

Characterization of Non-Symmetrical Damage in Smart Plate-Like Structures

Section: New Techniques

H. T. Banks, North Carolina State University
P. Emeric, North Carolina State University

La Jolla, CA

12:00 AM

Coupling Microstructure Outputs of Process Models to Ultrasonic Inspectability Predictions

Section: Process Modeling/Control

R. Bruce Thompson, Iowa State University
Frank J. Margetan, Iowa State University
I. Yalda, Iowa State University
Chien-Ping Chiou, Iowa State University
P. Panetta, Iowa State University

La Jolla, CA

12:00 AM

D2D: A Robust Technique for Detection of Structural Heterogeneities in Solids, Based on Transient Thermography

Section: New Techniques

A. Braggiotti, Consiglio Nazionale delle Ricerche
A. Mazzoldi, Consiglio Nazionale delle Ricerche
S. Marinetti, Consiglio Nazionale delle Ricerche

La Jolla, CA

12:00 AM

Defect Detection in Copper Products with an Infrared Line Scanner

Section: Process Modeling/Control

Jussi Varis, University of Helsinki

La Jolla, CA

12:00 AM

Development of On-Line NDE for the Continuous Resin Transfer Molding (CRTM)™ Process

Section: Process Modeling/Control

R. W. Engelbart, Boeing
D. D. Palmer, Boeing

La Jolla, CA

12:00 AM

Fresco Thermograph IC Inspection by Convective Heating Technique

Section: New Techniques

P. G. Bison, Consiglio Nazionale delle Ricerche
E. Grinzato, Consiglio Nazionale delle Ricerche
S. Marinetti, Consiglio Nazionale delle Ricerche
A. Braggiotti, Consiglio Nazionale delle Ricerche

La Jolla, CA

12:00 AM

High-Speed High-Resolution Subsurface Defect Detection in Ceramics Using Optical Gating Techniques

Section: New Techniques

M. Bashikansky, United States Navy
M. D. Duncan, United States Navy
J. Reintjes, United States Navy

La Jolla, CA

12:00 AM

High-Speed Monitoring of Surface Defects in Rail Tracks Using Ultrasonic Doppler Effect

Section: New Techniques

Shi-Chang Wooh, Massachusetts Institute of Technology
Arthur Clay, Massachusetts Institute of Technology

La Jolla, CA

12:00 AM

Model Based Predictive Control for the Tow-Placement Technique

Section: Process Modeling/Control

D. Heider, University of Delaware
J. W. Gillespie Jr., University of Delaware

La Jolla, CA

12:00 AM

Modeling of Microporosity Evolution During Solidification Processes

Section: Process Modeling/Control

J. Huang, Northwestern University
J. G. Conley, Northwestern University

La Jolla, CA

12:00 AM

NDT of Specimen of Complex Geometry Using Ultrasonic Adaptive Techniques - The F.A.U.S.T. System

Section: New Techniques

O. Roy, Commissariat à l’Energie Atomique
S. Mahaut, Commissariat à l’Energie Atomique
M. Serre, Commissariat à l’Energie Atomique

La Jolla, CA

12:00 AM

Non-Invasive Measurement of Prepreg Resin Content Using Nuclear Magnetic Resonance

Section: New Techniques

Geoffrey A. Barrall, Quantum Magnetics, Inc.
Peter V. Czipott, Quantum Magnetics, Inc.
Erik E. Magnuson, Quantum Magnetics, Inc.
Charles R. Moeller, Quantum Magnetics, Inc.
Suresh M. Menon, XXSYS Technologies, Inc.

La Jolla, CA

12:00 AM

Numerical Simulation of Self-Focusing of an Array on an Interior Crack

Section: New Techniques

Ming Zhang, Northwestern University
Jan D. Achenbach, Northwestern University

La Jolla, CA

12:00 AM

Photoinductive Imaging for Bolt Hole Corner Crack Inspection

Section: New Techniques

Cheng-Chi Tai, Iowa State University
John C. Moulder, Iowa State University

La Jolla, CA

12:00 AM

Recent Advances and Implementations of Flexible Eddy Current Probe Technology

Section: New Techniques

R. J. Filkins, General Electric
J. P. Fulton, General Electric
T. C. Patton, General Electric
J. D. Young, General Electric

La Jolla, CA

12:00 AM

Refining Automated Ultrasonic Inspections with Simulation Models

Section: New Techniques

M. Garton, Iowa State University

La Jolla, CA

12:00 AM

Response of Laser-Induced Thermal Lens Effect at Solid Surface

Section: New Techniques

Jian-wen Fang, Nanjing University
Shu-yi Zhang, Nanjing University

La Jolla, CA

12:00 AM

Saw-Cut Scanning Patterns

Section: New Techniques

W. F. Schmidt, University of Arkansas
O. H. Zinke, International Validators, Inc.

La Jolla, CA

12:00 AM

Self-Focusing of Rayleigh Waves: Simulation and Experiment

Section: New Techniques

W. A. K. Deutsch, Northwestern University
A. Cheng, Northwestern University
Jan D. Achenbach, Northwestern University

La Jolla, CA

12:00 AM

Simultaneous Determination of Orientation and Thickness in Anisotropic Media

Section: New Techniques

Ronald A. Kline, San Diego State University
John B. Deaton, General Electric
D. R. Howard, General Electric

La Jolla, CA

12:00 AM

Spatial Resolution with Time-and-Polarization-Resolved Acoustic Microscopy

Section: New Techniques

D. Xiang, National Institute of Standards and Technology
N. N. Hsu, National Institute of Standards and Technology
S. E. Fick, National Institute of Standards and Technology
G. V. Blessing, National Institute of Standards and Technology

La Jolla, CA

12:00 AM

Thickness Measurements of Curved Multi-Layered Polymer System Using Ultrasonic Pulse-Echo Method

Section: New Techniques

R. Gr. Maev, University of Windsor
H. Shao, University of Windsor
E. Yu. Maeva, University of Windsor

La Jolla, CA

12:00 AM

Time-Resolved Line Focus Acoustic Microscopy Using Lamb Waves for Material Characterization of Thin Plates

Section: New Techniques

Johannes Vollmann, Northwestern University
Ansheng Cheng, Northwestern University
Jan D. Achenbach, Northwestern University

La Jolla, CA

12:00 AM

Ultrasonic Measurement of Clearances of a Rolling-Piston Type Rotary Compressor

Section: Process Modeling/Control

Nohyu Kim, LG Electronics, Inc.
Jinsoo Kim, LG Electronics, Inc.

La Jolla, CA

12:00 AM

Ultrasonic Monitoring of Recrystallization Textures in Aluminum

Section: Process Modeling/Control

G. Liu, Iowa State University
F. Laabs, Iowa State University
David K. Rehbein, Iowa State University
Otto Buck, Iowa State University
R. Bruce Thompson, Iowa State University

La Jolla, CA

12:00 AM

Ultrasonic Wave Propagation in a Tooth Phantom

Section: New Techniques

S. R. Ghorayeb, Hofstra University
T. Xue, California Institute of Technology
William Lord, Iowa State University

La Jolla, CA

12:00 AM

Wide-Area Imaging of Ultrasonic Fields by Digital Phase-Stepping Shearography

Section: New Techniques

G. A. Gordon, Pennsylvania State University
B. A. Baird `, Pennsylvania State University
S. Wu, Pennsylvania State University

La Jolla, CA

12:00 AM