Location

La Jolla, CA

Start Date

1-1-1998 12:00 AM

Description

Besides providing comparable resolution as light microscope, acoustic microscope (AM) has its unique application in the area material characterization. Material characterization using AM is based on the measurement of leaky surface wave speed, which is extracted from the so-called V(z) curve[1]. In this V(z) technique, usually a tonebust mode of operation is required and relatively higher equipment cost is needed.

Book Title

Review of Progress in Quantitative Nondestructive Evaluation

Volume

17A

Chapter

Chapter 1: Standard Techniques

Section

Guided Waves and Applications

Pages

177-184

DOI

10.1007/978-1-4615-5339-7_22

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Characterization of Piezoelectrics Using Line-Focus Transducer

La Jolla, CA

Besides providing comparable resolution as light microscope, acoustic microscope (AM) has its unique application in the area material characterization. Material characterization using AM is based on the measurement of leaky surface wave speed, which is extracted from the so-called V(z) curve[1]. In this V(z) technique, usually a tonebust mode of operation is required and relatively higher equipment cost is needed.