Location

La Jolla, CA

Start Date

1-1-1998 12:00 AM

Description

GE has recently developed a family of flexible circuit eddy current sensors in an effort to provide our customers with cost effective solutions to the inspection of complexly shaped, metallic surfaces. The new family of eddy current sensors, comprised of single element and multi-element conformable probes, are lower cost derivatives of the multiple coil Eddy Current Array Probe (ECAP) previously developed by GE [1]. This paper discusses the major aspects of flexible circuit sensor optimization. These include consideration of eddy current coil orientation and geometry, operating frequency, and instrumentation.

Book Title

Review of Progress in Quantitative Nondestructive Evaluation

Volume

17B

Chapter

Chapter 7: New Inspection/Control Procedures

Section

New Techniques

Pages

1809-1816

DOI

10.1007/978-1-4615-5339-7_234

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Recent Advances and Implementations of Flexible Eddy Current Probe Technology

La Jolla, CA

GE has recently developed a family of flexible circuit eddy current sensors in an effort to provide our customers with cost effective solutions to the inspection of complexly shaped, metallic surfaces. The new family of eddy current sensors, comprised of single element and multi-element conformable probes, are lower cost derivatives of the multiple coil Eddy Current Array Probe (ECAP) previously developed by GE [1]. This paper discusses the major aspects of flexible circuit sensor optimization. These include consideration of eddy current coil orientation and geometry, operating frequency, and instrumentation.