Location

La Jolla, CA

Start Date

1-1-1998 12:00 AM

Description

Since the market introduction of the commercial system ComScan 160 [1] X-ray backscatter imaging has become an established inspection technique in certain areas of nondestructive testing, e.g. corrosion inspection on aircrafts. Several preceding publications on X-ray backscatter imaging have been focussed on the current status of the ComScan system and on topical applications [2,3,4]. In the present article the horizon shall be opened to all relevant results which have been obtained worldwide with X-ray backscatter techniques. Due to space limitations it is certainly not possible to give a complete overview, but some selected results will be reported. In reference [5] additional information and many references to this topic can be found. Furthermore, in that work reference is also given to the patent situation. Additionally to this, an overview on the history of X-ray backscatter techniques, on physical and technical foundations of the techniques and its numerous variations will be given in chapter 3.1.5 of the to-be-published handbook on NDT [6] (in German).

Book Title

Review of Progress in Quantitative Nondestructive Evaluation

Volume

17A

Chapter

Chapter 1: Standard Techniques

Section

X-Rays and Computed Tomography

Pages

379-385

DOI

10.1007/978-1-4615-5339-7_48

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Status and Future Aspects of X-Ray Backscatter Imaging

La Jolla, CA

Since the market introduction of the commercial system ComScan 160 [1] X-ray backscatter imaging has become an established inspection technique in certain areas of nondestructive testing, e.g. corrosion inspection on aircrafts. Several preceding publications on X-ray backscatter imaging have been focussed on the current status of the ComScan system and on topical applications [2,3,4]. In the present article the horizon shall be opened to all relevant results which have been obtained worldwide with X-ray backscatter techniques. Due to space limitations it is certainly not possible to give a complete overview, but some selected results will be reported. In reference [5] additional information and many references to this topic can be found. Furthermore, in that work reference is also given to the patent situation. Additionally to this, an overview on the history of X-ray backscatter techniques, on physical and technical foundations of the techniques and its numerous variations will be given in chapter 3.1.5 of the to-be-published handbook on NDT [6] (in German).