Location

La Jolla, CA

Start Date

1-1-1998 12:00 AM

Description

X-ray computed tomography (CT) has become an important non-destructive evaluation technique. CT contributes to a wide range of nondestructive evaluation (NDE) applications [1]. These include typical NDE applications (e.g., defect detection and quality control), more advanced NDE applications (e.g., process development and model verification), and the more recent application of CT-based metrology (e.g., geometric inspection and reverse engineering). In the traditional applications of CT, the user is concerned with defect sensitivity, which is a combination of spatial resolution, contrast sensitivity and slice thickness [2]. For CT-based metrology, the term “defect sensitivity” has little meaning; dimensional accuracy of the system becomes paramount.

Book Title

Review of Progress in Quantitative Nondestructive Evaluation

Volume

17A

Chapter

Chapter 1: Standard Techniques

Section

X-Rays and Computed Tomography

Pages

411-417

DOI

10.1007/978-1-4615-5339-7_52

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

Dimensional Accuracy in X-Ray Computed Tomography Imaging

La Jolla, CA

X-ray computed tomography (CT) has become an important non-destructive evaluation technique. CT contributes to a wide range of nondestructive evaluation (NDE) applications [1]. These include typical NDE applications (e.g., defect detection and quality control), more advanced NDE applications (e.g., process development and model verification), and the more recent application of CT-based metrology (e.g., geometric inspection and reverse engineering). In the traditional applications of CT, the user is concerned with defect sensitivity, which is a combination of spatial resolution, contrast sensitivity and slice thickness [2]. For CT-based metrology, the term “defect sensitivity” has little meaning; dimensional accuracy of the system becomes paramount.